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Indian Phytopathology

, Volume 71, Issue 2, pp 291–294 | Cite as

Assessment of yield loss of wheat caused by spot blotch using regression model

  • Hijam Meronbala Devi
  • Sunita Mahapatra
  • Srikanta Das
SHORT COMMUNICATION

Abstract

Yield loss of wheat caused by Bipolaris sorokiniana is a major concern of wheat growers in North eastern plain zones of India. Experiment was conducted in randomized block design to assess yield loss and avoidable yield loss caused by spot blotch to develop linear regression model. Where area under disease progress curve (AUDPC) was taken as predictor and regressed to the loss in yield. Linear regression analysis between yield versus AUDPC. The avoidable yield loss of grain yield for two consecutive years showed that the attainable yield of wheat grain was 44.49–44.98 q ha−1 and 1000 grain weight 45.21–47.16 g and drop of 1.8–2.0 kg ha−1 grain yield and 0.89–1.59 g 1000 grain weight due to every one percent unit increase in AUDPC. Similarly, in case of avoidable yield loss and 1000 grain weight, 40.99–44.12% and 17.06–20.50% 1000 grain weight could be avoided due to every one percent decrease in AUDPC.

Keywords

AUDPC Avoidable yield loss Bipolaris sorokiniana Regression model 

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Copyright information

© Indian Phytopathological Society 2018

Authors and Affiliations

  • Hijam Meronbala Devi
    • 1
  • Sunita Mahapatra
    • 1
  • Srikanta Das
    • 1
  1. 1.Department of Plant PathologyBidhan Chandra Krishi ViswavidyalayaMohanpurIndia

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