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Bootstrap confidence intervals of CNpk for exponentiated Fréchet distribution

  • Srinivasa Rao GaddeEmail author
  • K. Rosaiah
  • Sridhar Babu Mothukuri
Original Research

Abstract

Confidence intervals for process capability index using bootstrap method (Chen and Pearn, Qual Reliab Eng Int 13(6), 355–360, 1997) are constructed through simulation assuming that the underlying distribution is exponentiated Fréchet distribution (EFD). Parameters are estimated by Maximum likelihood (ML) method. Also obtain the estimated coverage probabilities and average widths of the bootstrap confidence intervals through Monte Carlo simulation. Illustrate the process capability indices for EFD using some numerical examples.

Keywords

Exponentiated Fréchet distribution Process capability index Bootstrap confidence interval Maximum likelihood estimation Monte Carlo simulation 

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Copyright information

© Society for Reliability and Safety (SRESA) 2018

Authors and Affiliations

  1. 1.Department of StatisticsThe University of DodomaDodomaTanzania
  2. 2.Department of StatisticsAcharya Nagarjuna UniversityGunturIndia

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