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Effects of energy deposition on mechanical properties of sodium borosilicate glass irradiated by three heavy ions: P, Kr, and Xe

  • Xin Du
  • Tian-Tian Wang
  • Bing-Huang Duan
  • Xiao-Yang Zhang
  • Feng-Fei Liu
  • Chang-Lin Lan
  • Guang-Fu Wang
  • Liang Chen
  • Hai-Bo PengEmail author
  • Tie-Shan WangEmail author
Article

Abstract

Sodium borosilicate glasses are candidate materials for high-level radioactive waste vitrification; therefore, understanding the irradiation effects in model borosilicate glass is crucial. Effects of electronic energy deposition and nuclear energy deposition induced by the impact of heavy ions on the hardness and Young’s modulus of sodium borosilicate glass were investigated. The work concentrates on sodium borosilicate glasses, henceforth termed NBS1 (60.0% SiO2, 15.0% B2O3, and 25.0% Na2O in mol%). The NBS1 glasses were irradiated by P, Kr, and Xe ions with 0.3 MeV, 4 MeV, and 5 MeV, respectively. The hardness and Young’s modulus of ion-irradiated NBS1 glasses were measured by nanoindentation tests. The relationships between the evolution of the hardness, the change in the Young’s modulus of the NBS1 glasses, and the energy deposition were investigated. With the increase in the nuclear energy deposition, both the hardness and Young’s modulus of NBS1 glasses dropped exponentially and then saturated. Regardless of the ion species, the nuclear energy depositions required for the saturation of hardness and Young’s modulus were apparent at approximately 1.2 × 1020 keV/cm3 and 1.8 × 1020 keV/cm3, respectively. The dose dependency of the hardness and Young’s modulus of NBS1 glasses was consistent with previous studies by Peuget et al. Moreover, the electronic energy loss is less than 4 keV/nm, and the electronic energy deposition is less than 3.0 × 1022 keV/cm3 in this work. Therefore, the evolution of hardness and Young’s modulus could have been primarily induced by nuclear energy deposition.

Keywords

Borosilicate glass Hardness Young’s modulus Irradiation Nuclear energy deposition 

Notes

Acknowledgments

The authors are grateful to the staff of the 320-kV ECR HCIs Platform at IMP (Lanzhou), and the staff of the Public Center for Characterization and Test at Suzhou Institute of Nano-tech and Nano-bionics for their technical support.

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Copyright information

© China Science Publishing & Media Ltd. (Science Press), Shanghai Institute of Applied Physics, the Chinese Academy of Sciences, Chinese Nuclear Society and Springer Nature Singapore Pte Ltd. 2019

Authors and Affiliations

  • Xin Du
    • 1
  • Tian-Tian Wang
    • 1
  • Bing-Huang Duan
    • 1
  • Xiao-Yang Zhang
    • 1
  • Feng-Fei Liu
    • 1
  • Chang-Lin Lan
    • 1
  • Guang-Fu Wang
    • 2
  • Liang Chen
    • 1
  • Hai-Bo Peng
    • 1
    Email author
  • Tie-Shan Wang
    • 1
    Email author
  1. 1.School of Nuclear Science and TechnologyLanzhou UniversityLanzhouChina
  2. 2.Key Laboratory of Beam Technology and Material Modification of Ministry of EducationBeijing Normal UniversityBeijingChina

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