Reliability Analysis for Electronic Devices Using Beta Generalized Weibull Distribution
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This study deals with the reliability analysis of electronic devices under different voltages assuming modified beta generalized Weibull distribution using power law rule. The parameters of the modified distribution are estimated using Bayesian inference as it allows to incorporate the prior information. Sensitivity of hyperparameters and selection of an appropriate probability model are also described within the study.
KeywordsElectronic devices Beta generalized Weibull distribution Bayesian estimation Sensitivity analysis Inverse power law Voltage Prior distribution
Mathematics Subject Classification62F15 62P30 62E15
The work of Sajid Ali and Ismail Shah is funded by the Higher Education Commission (HEC), Pakistan under the Startup Research Grant Program (SRGP) Project #1859 entitled “A comparison of Reliability analysis for electronic devices using beta generalized Weibull and generalized exponential distributions.” Both authors acknowledge the funding provided by the HEC. Further, the authors also acknowledge the feedback of anonymous reviewers to improve the presentation of the work.