Dielectric study of Ti-doped Bi2VO5.5 solid electrolyte
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Synthesis and characterization of Bi2V1−xTixO5.5−(x/2)−δ (0 ≤ x ≤ 0.150) was done. For the present system, the lower limit of Ti required for near-complete tetragonal phase stabilization has been found to be x = 0.125. The optimum values of ionic conductivity were obtained for the compositions; Bi2V0.875Ti0.125O5.4375 and Bi2V0.9Ti0.1O5.45 at 300 °C and 600 °C, respectively. Interestingly, two peaks have been observed in frequency versus dielectric loss spectra for parent compound, which is in \(\alpha\)-orthorhombic phase, as well as for tetragonal phase stabilized specimens with compositions x ≥ 0.125 at temperatures below 300 °C. No such peaks have been found in \(\beta\)-orthorhombic (x = 0.085) as well as in mixed tetragonal and orthorhombic (x = 0.1 and 0.1125) phases. Thus, we propose that frequency-dependent dielectric loss spectra can be used to qualitatively distinguish \(\alpha\) and \(\gamma\)-phases from \(\beta\)-phase in BITIVOX system and it is the central result of this work.
KeywordsBITIVOX XRD Phase transition Ionic conduction Dielectric relaxation
PACS No.77.22 Gm
The authors are grateful to DST, New Delhi, for providing the FIST facility (Sanction Order Number SB/52/CMP-093/2013) in the Physics department for XRD and impedance studies. One of the authors (AJS) gratefully acknowledges DST, New Delhi, for INSPIRE fellowship.
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