Journal of Optics

, Volume 47, Issue 4, pp 504–510 | Cite as

Optical properties and surface energy of tellurium oxide thin film

  • İ. Afşin KariperEmail author
Research Article


In this study, tellurium oxide thin film (TOTF) was deposited on amorphous glass using chemical bath deposition method. Structural properties of the film were analyzed through X-ray diffraction. As a result of these analyses, average grain size was found to be 48 nm. Film thickness was measured using an atomic force microscopy at 1200 nm, whereas its optical properties were examined through UV–Vis spectroscopic technique. TOTF’s optical properties, which are already known, were compared with the related data in the literature, and in addition, unknown optical properties of TOTF were investigated. Transmittance of the film was found to be 45%, whereas its refractive index was found to be 2.63 at 550 nm wavelengths. The thin film of tellurium oxide is transparent, its optical band gap was graphically estimated to be 1.57 eV, and its surface energy was calculated to be 32.44 mN/m. Distilled water, which is used as one of the test liquids, showed that TOTF is hydrophobic. Structural properties of the films were found to be in line with the literature.


Tellurium oxide thin film Chemical bath deposition Surface tension 



The author thanks a lot to Zeynep ÖLÇÜ, and Emine GÜNERİ.


  1. 1.
    M. Sathish, B. Eraiah, Synthesis and structural characterization of niobium doped lead-telluride glass-ceramics. Mater. Sci. Eng. 73, 0121371–0121376 (2015)Google Scholar
  2. 2.
    K.K. Vu, S. Farahani, S. Madden, 980 nm pumped erbium doped tellurium oxide planar rib waveguide laser and amplifier with gain in S, C and L band. Opt. Exp. 23, 747–755 (2015)ADSCrossRefGoogle Scholar
  3. 3.
    T.K. Maity, S.L. Sharma, Effect of gamma radiation on optical and electrical properties of tellurium dioxide thin films. Bull. Mater. Sci. 31, 841–846 (2008)CrossRefGoogle Scholar
  4. 4.
    H. Kong, J.B. Yeo, H.Y. Lee, A study on the properties of tellurium-oxide thin films based on the variable sputtering gas ratio. J. Korean Phys. Soc. 66, 1744–1749 (2015)ADSCrossRefGoogle Scholar
  5. 5.
    J.H. Saadie, A.A. Hasan, Influence of thickness on electrical and optical properties of tellurium thin films deposited by chemical spray pyrolysis. Int. J. App. Math. Electron. Comput. 3, 96–101 (2015)CrossRefGoogle Scholar
  6. 6.
    A. Pergament, G. Stefanovich, V. Malinenko, A. Velichko, Electrical switching in thin film structures based on transition metal oxides. Adv. Condens. Matter Phys. 2015, 1–26 (2015)CrossRefGoogle Scholar
  7. 7.
    S.K.J. Al-Ani, C.A. Hogarth, Relations between the structure and the optical properties of glass and amorphous thin films of tellurite. Int. J. Electron. 58, 123–131 (1985)CrossRefGoogle Scholar
  8. 8.
    M. Di Giulio, M.C. Nicotra, R. Re, M. Rella, P. Siciliano, Optical absorption and structural characterization of reactively sputtered tellurium suboxide thin films. Appl. Surf. Sci. 65(66), 313–318 (1993)ADSCrossRefGoogle Scholar
  9. 9.
    İ.A. Kariper, Structural, optical and porosity properties of CdI2 thin film. J. Mater. Res. Technol. 5, 77–83 (2016)CrossRefGoogle Scholar
  10. 10.
    M.F. Al-Kuhaili, S.M.A. Durrani, E.E. Khawaja, J. Shirokoff, Effects of preparation conditions on the optical properties of thin films of tellurium oxide. J. Phys. D Appl. Phys. 35, 910–915 (2002)ADSCrossRefGoogle Scholar
  11. 11.
    İ.A. Kariper, Optical and structural properties of PbI2 thin film produced via chemical dipping method. Opt. Rev. 23, 401–408 (2016)CrossRefGoogle Scholar
  12. 12.
    Y.L. Cheng, C.J. Huang, Cleaning solution effect on electrical and reliability properties of dense and porous low dielectric constant materials. ECS Trans. 66, 165–176 (2015)CrossRefGoogle Scholar
  13. 13.
    S.S. Yu, G.J. Yuan, H.B. Duan, The low dielectric constant and relaxation dielectric behavior in hydrogen-bonding metal–organic frameworks. RSC Adv. 5, 45213–45216 (2015)CrossRefGoogle Scholar
  14. 14.
    İ.A. Kariper, Critical surface tension, critical surface energy and parachor Of MnSO3 thin film. Surf. Rev. Lett. 23, 16500091–16500098 (2016)CrossRefGoogle Scholar
  15. 15.
    İ.A. Kariper, Optical and structural properties and surface tension of uranium oxide thin film. Int. J. Surf. Sci. Eng. 10, 432–443 (2016)CrossRefGoogle Scholar
  16. 16.
    F. Meydaneri Tezel, İ.A. Kariper, Effect of pH on optic and structural characterization of chemical deposited AgI thin films. Mater. Res. Ibero-American J. Mater. 20, 1563–1570 (2017)Google Scholar
  17. 17.
    S. Korkmaz, F. Meydaneri Tezel, İ.A. Kariper, Synthesis and characterization of GO/IrO2 thin film supercapacitor. J. Alloys Compd. 754, 14–25 (2018)CrossRefGoogle Scholar
  18. 18.
    A. Lecomte et al., Sol–gel processing of TeO2 thin films from citric acid stabilised tellurium isopropoxide precursor. J. Eur. Ceram. Soc. 27, 1151–1158 (2007)CrossRefGoogle Scholar
  19. 19.
    N. Dewan, K. Sreenivas, V. Gupta, Properties of crystalline γ-TeO2 thin film. J. Cryst. Growth 305, 237–241 (2007)ADSCrossRefGoogle Scholar

Copyright information

© The Optical Society of India 2018

Authors and Affiliations

  1. 1.Education FacultyErciyes UniversityKayseriTurkey

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