Journal of Central South University of Technology

, Volume 14, Issue 6, pp 759–762 | Cite as

Preparation and electrical properties of BaPbO3 thin film

  • Lu Yu-dong  (陆裕东)
  • Wang Xin  (王 歆)Email author
  • Zhuang Zhi-qiang  (庄志强)


BaPbO3 thin films were deposited on Al2O3 substrates by sol-gel spin-coating and rapid thermal annealing. The microstructure and phase of BaPbO3 thin films were determined by X-ray diffractometry, scanning electrons microscopy and energy dispersive X-ray spectrometry. The influence of annealing temperature and annealing time on sheet resistance of the thin films was investigated. The results show that heat treatment, including annealing temperature and time, causes notable change in molar ratio of Pb to Ba, resulting in the variations of sheet resistance. The variation of electrical properties demonstrates that the surface state of the film changes from two-dimensional behavior to three-dimensional behavior with the increase of film thickness. Crack-free BaPbO3 thin films with grain size of 90 nm can be obtained by a rapid thermal annealing at 700 °C for 10 min. And the BaPbO3 films with a thickness of 2.5 μm has a sheet resistance of 35 Θ·□−1.

Key words

BaPbO3 thin films sol-gel spin-coating electrical resistivity heat treatment 


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Copyright information

© Published by: Central South University Press, Sole distributor outside Mainland China: Springer 2007

Authors and Affiliations

  • Lu Yu-dong  (陆裕东)
    • 1
    • 2
  • Wang Xin  (王 歆)
    • 1
    Email author
  • Zhuang Zhi-qiang  (庄志强)
    • 1
  1. 1.College of Materials Science and EngineeringSouth China University of TechnologyGuangzhouChina
  2. 2.National Key Laboratory for Reliability Physics and its Application Technology of Electrical Componentthe 5th Electronics Research Institute of Ministry of Information IndustryGuangzhouChina

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