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Journal of Failure Analysis and Prevention

, Volume 19, Issue 3, pp 608–611 | Cite as

Industry Updates

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Hitachi High-Tech Microspot X-Ray Fluorescence Analyzer Now Offered by Eastern Applied Research

Eastern Applied Research, Buffalo, New York, recently named an Authorized Distributor of Hitachi High-Tech Science Corporation, now offers an x-ray fluorescence (XRF) analyzer developed for ultrathin film measurements and microspot analysis needs: the Hitachi FT-150 series. Among other applications, this analyzer is relied upon in printed circuit board quality control and process control in semiconductor wafer fabrication.

The Hitachi FT-150 provides industry-leading performance by combining high-quality components and optimized geometry. A primary component of the Hitachi FT-150 is its newly developed polycapillary optics, which work like a convex lens to focus x-rays onto a microspot through several thousand glass capillary tubes. The Vortex silicon drift detector offers improved detector technology over previous configurations, and results in greater resolution capabilities with increased...

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