Journal of Electronic Materials

, Volume 48, Issue 5, pp 3351–3354 | Cite as

Thin Films of CuFeS2 Prepared by Flash Evaporation Technique and Their Structural Properties

  • Barys KorzunEmail author
  • Anatoly Galyas
Topical Collection: 60th Electronic Materials Conference 2018
Part of the following topical collections:
  1. 60th Electronic Materials Conference 2018


Thin films of chalcopyrite CuFeS2 were deposited on glass substrates by flash evaporation. The resulting film structure was analyzed by scanning electron microscopy (SEM) combined with energy dispersive x-ray spectroscopy (EDS). It was detected that the thin films consist of separate grains of almost equal areas of about (200–400) μm2. The thin films of chalcopyrite CuFeS2 have chemical composition with an atomic content of Cu, Fe, and S of 25.22 at.%, 23.38 at.%, and 51.40 at.% and atomic ratios of Cu/Fe and S/(Cu + Fe) equal to 1.08 and 1.06, respectively, which slightly differ from the theoretical values equal to 1 for both atomic ratios. A small inclusion of the second phase with chemical composition with the atomic content of Cu, Fe, and S of 29.24 at.%, 25.24 at.%, and 45.52 at.% was detected and can be attributed to talnakhite Cu9Fe8S16. The observed cracking of the thin films is explained by the separation of the additional phase with the structure of chalcocite Cu2S, which occurs during cooling of the thin films.


Thin films chalcopyrite scanning electron microscopy energy dispersive x-ray spectroscopy chemical composition 


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One of the authors (Dr. Barys Korzun) would like to thank PSC-CUNY for financial support of the studies through projects TRADA-48-527 and TRADA-49-552.


  1. 1.
    C.A. Wolden, J. Kurtin, J.B. Baxter, I. Repins, S.E. Shaheen, J.T. Torvik, A.A. Rockett, V.M. Fthenakis, and E.S. Aydil, J. Vac. Sci. Technol. A 29, 030801 (2011).CrossRefGoogle Scholar
  2. 2.
    A. Zakutayev, Curr. Opin. Green Sustain. Chem. 4, 8 (2017).CrossRefGoogle Scholar
  3. 3.
    Y. Bu, Y. Yuan, C.L. Exstrom, S.A. Darveau, and J. Huang, Nano Lett. 11, 4953 (2011).CrossRefGoogle Scholar
  4. 4.
    L.J. Cabri, Econ. Geol. 68, 443 (1973).CrossRefGoogle Scholar
  5. 5.
    L.J. Cabri, Econ. Geol. 62, 910 (1967).CrossRefGoogle Scholar
  6. 6.
    L.J. Cabri and D.C. Harris, Econ. Geol. 66, 673 (1971).CrossRefGoogle Scholar
  7. 7.
    L.J. Cabri and S.R. Hall, Am. Mineral. 57, 689 (1972).Google Scholar
  8. 8.
    L.V. Kradinova, A.M. Polubotko, V.V. Popov, V.D. Prochukhan, Yu.V. Rud, and V.E. Skoriukin, Semicond. Sci. Technol. 8, 1616 (1993).CrossRefGoogle Scholar
  9. 9.
    I.G. Austin, C.H.L. Goodman, and A.E. Pengelly, J. Electrochem. Soc. 103, 609 (1956).CrossRefGoogle Scholar
  10. 10.
    K. Kondo, T. Teranishi, and K. Sato, J. Phys. Soc. Jpn. 36, 311 (1974).CrossRefGoogle Scholar
  11. 11.
    T. Teranishi, K. Sato, and K. Kondo, J. Phys. Soc. Jpn. 36, 1618 (1974).CrossRefGoogle Scholar
  12. 12.
    L. Barkat, N. Hamdadou, M. Morsli, A. Khelil, and J.C. Bernede, J. Cryst. Growth 297, 426 (2006).CrossRefGoogle Scholar
  13. 13.
    R.A. Yund and G. Kullerud, J. Petrol. 7, 454 (1966).CrossRefGoogle Scholar
  14. 14.
    B.V. Korzun, S. Schorr, A.N. Gavrilenko, V.L. Matukhin, J.A. Fedotova, M. Rusu, and M.C. Lux-Steiner, in Program and Abstracts of the 18-th International Conference on Ternary and Multinary Compounds (ICTMC18), Salzburg, Austria, August 27–31, 2012. Salzburg, 2012. Abstract P09-P09, 132.Google Scholar
  15. 15.
    S. Schorr, B.V. Korzun, L.S. Lobanovski, K.I. Yanushkevich, A.I. Galyas, V.R. Sobol, A.N. Gavrilenko, and V.L. Matukhin, in Abstracts of European Congress and Exhibition on Advanced Materials and Processes EUROMAT2013, Sevilla, Spain, September 8–13, 2013/Sevilia, 2013. Abstract E1II-P-TH-PS2-22.Google Scholar
  16. 16.
    D. Tonpe, K. Gattu, G. More, D. Upadhye, S. Mahajan, and R. Sharma, in AIP Conference Proceedings (2016), p. 020676.
  17. 17.
    K. Sato and T. Teranishi, J. Phys. Soc. Jpn. 40, 297 (1976).CrossRefGoogle Scholar
  18. 18.
    D. Sridevi, J.J.B. Prasad, and K.V. Reddy, Bull. Mater. Sci. 8, 319 (1986).CrossRefGoogle Scholar
  19. 19.
    JCPDS Card No. 65-1573/S.R. Hall and J.M. Stewart (1973) Acta Crystallogr. B29, 579.Google Scholar

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© The Minerals, Metals & Materials Society 2019

Authors and Affiliations

  1. 1.The City University of New York, Borough of Manhattan Community CollegeNew YorkUSA
  2. 2.Scientific-Practical Materials Research Centre of the National Academy of Sciences of BelarusMinskBelarus

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