Journal of Electronic Materials

, Volume 48, Issue 2, pp 972–976 | Cite as

Low-Temperature Sintering and Microwave Dielectric Properties of CaMoO4 Ceramics

  • Tao Hong
  • Yongda HuEmail author
  • Shengxiang Bao
  • Chuan Luo
  • Libo Ai
  • Pengbo Jiang
  • Jie Chen
  • Zongzhi Duan


Low-loss CaMoO4 dielectric ceramics with scheelite structure have been synthesized by a solid-state route. The effects of BaCu(B2O5) (BCB) dopant on the micromorphology, density, and microwave dielectric properties of CaMoO4 ceramic were studied. BCB dopant could effectively reduce the sintering temperature of the ceramic to 875°C, while the dielectric properties decreased only slightly. In particular, 0.75 wt.% BCB-doped CaMoO4 ceramic sintered at 875°C presented good microwave dielectric properties of εr = 10.67, Q × f = 84,775 GHz, and τf = − 46.48 ppm/°C. Besides, energy-dispersive x-ray spectroscopy (EDX) line scanning analysis confirmed that the CaMoO4 ceramics exhibited good chemical compatibility with silver electrodes and could thus be applied in low-temperature cofired ceramic (LTCC) technology.


Microwave dielectric ceramics CaMoO4 BaCu(B2O5LTCC 


Unable to display preview. Download preview PDF.

Unable to display preview. Download preview PDF.


  1. 1.
    M.T. Sebastian, Dielectric Materials for Wireless Communication (Oxford: Elsevier, 2010).Google Scholar
  2. 2.
    G. Wang, H.W. Zhang, C. Liu, H. Su, L.J. Jia, J. Li, X. Huang, and G.W. Gan, J. Electron. Mater. 47, 8 (2018).Google Scholar
  3. 3.
    S.Z. Hao, D. Zhou, W.B. Li, and L.X. Pang, J. Electron. Mater. 46, 11 (2017).Google Scholar
  4. 4.
    D. Zhou, L.X. Pang, D.W. Wang, C. Li, B.B. Jin, and I.M. Reaney, J. Mater. Chem. C 5, 38 (2017).Google Scholar
  5. 5.
    C.C. Li, H. Luo, H.C. Xiang, Y. Tang, and L. Fang, J. Electron. Mater. 46, 7 (2017).Google Scholar
  6. 6.
    B.K. Kim, D.W. Lee, S.H. Key, T.J. Jo, S.M. Jeong, K.J. Kim, M.S. Jeon, J.K. Song, and Y.S. Cho, J. Am. Ceram. Soc. 93, 8 (2010).Google Scholar
  7. 7.
    P.S. Anjana, T. Joseph, and M.T. Sebastian, J. Alloys Compd. 490, 1 (2010).CrossRefGoogle Scholar
  8. 8.
    M.Z. Dong, Z.X. Yue, H. Zhuang, S.Q. Meng, and L.T. Li, J. Alloys Compd. 91, 12 (2008).Google Scholar
  9. 9.
    W.S. Brower and P.H. Fang, Phys. Rev. 149, 2 (1966).CrossRefGoogle Scholar
  10. 10.
    G.K. Choi, J.R. Kim, S.H. Yoon, and K.S. Hong, J. Eur. Ceram. Soc. 27, 8 (2007).Google Scholar
  11. 11.
    L.F. Zhou, H.X. Lin, W. Chen, and L. Luo, Jpn. J. Appl. Phys. 47, 9 (2008).Google Scholar
  12. 12.
    M.H. Kim, Y.H. Jeong, S. Nahm, H.T. Kim, and H.J. Lee, J. Eur. Ceram. Soc. 26, 10 (2006).Google Scholar
  13. 13.
    M.H. Kim, J.B. Lim, J.C. Kim, S. Nahm, J.H. Paik, J.H. Kim, and K.S. Park, J. Am. Ceram. Soc. 89, 10 (2006).Google Scholar
  14. 14.
    B.W. Hakki, and P.D. Coleman, IRE Trans. Microwave Theory Tech. 8, 4 (1960).CrossRefGoogle Scholar
  15. 15.
    W.E. Courtney, IEEE Trans. Microwave Theory Tech. 18, 8 (1970).Google Scholar
  16. 16.
    S.Q. Yu, B. Tang, S.R. Zhang, and X. Zhang, Mater. Lett. 67, 1 (2012).CrossRefGoogle Scholar
  17. 17.
    G. Wang, H.W. Zhang, C. Liu, H. Su, J. Li, X. Huang, G.W. Gan, and F. Xu, Mater. Lett. 217, 48 (2018).CrossRefGoogle Scholar
  18. 18.
    P. Zhang, H. Xie, Y.G. Zhao, X.Y. Zhao, and M. Xiao, J. Alloys Compd. 690, 688 (2017).CrossRefGoogle Scholar
  19. 19.
    Q.W. Liao, L.X. Li, X. Ren, X.X. Yu, Q.L. Meng, and W.S. Xia, Mater. Lett. 89, 351 (2012).CrossRefGoogle Scholar
  20. 20.
    M. Guo, S.P. Gong, G. Dou, and D.X. Zhou, J. Alloys Compd. 509, 20 (2011).Google Scholar
  21. 21.
    Y.G. Wu, X.H. Zhao, F. Li, and Z.G. Fan, J. Electroceram. 11, 3 (2003).CrossRefGoogle Scholar
  22. 22.
    L.X. Pang, H. Wang, D. Zhou, and X. Yao, J. Alloys Compd. 493, 1 (2010).CrossRefGoogle Scholar
  23. 23.
    X.B. Liu, H.F. Zhou, L. Fang, X.L. Chen, Y.L. Wang, and W. Liao, Jpn. J. Appl. Phys. 51, 8 (2012).Google Scholar
  24. 24.
    H.H. Xi, D. Zhou, H.D. Xie, B. He, and Q.P. Wang, J. Am. Ceram. Soc. 98, 2 (2015).CrossRefGoogle Scholar
  25. 25.
    L.X. Pang, D. Zhou, and W.G. Liu, J. Am. Ceram. Soc. 97, 7 (2014).CrossRefGoogle Scholar
  26. 26.
    J. Guo, D. Zhou, L. Wang, H. Wang, T. Shao, Z.M. Qi, and X. Yao, Dalton Trans. 42, 5 (2013).Google Scholar

Copyright information

© The Minerals, Metals & Materials Society 2018

Authors and Affiliations

  • Tao Hong
    • 1
  • Yongda Hu
    • 1
    Email author
  • Shengxiang Bao
    • 1
  • Chuan Luo
    • 1
  • Libo Ai
    • 1
  • Pengbo Jiang
    • 1
  • Jie Chen
    • 2
  • Zongzhi Duan
    • 2
  1. 1.University of Electronic Science and Technology of ChinaChengduChina
  2. 2.Microwave Circuit and System InstituteChengdu Yaguang Electronics Co. Ltd.ChengduChina

Personalised recommendations