Frontiers of Physics

, 14:33401 | Cite as

Local electrical characterization of two-dimensional materials with functional atomic force microscopy

  • Sabir Hussain
  • Kunqi Xu
  • Shili Ye
  • Le Lei
  • Xinmeng Liu
  • Rui XuEmail author
  • Liming Xie
  • Zhihai Cheng
Review Article


Research about two-dimensional (2D) materials is growing exponentially across various scientific and engineering disciplines due to the wealth of unusual physical phenomena that occur when charge transport is confined to a plane. The applications of 2D materials are highly affected by the electrical properties of these materials, including current distribution, surface potential, dielectric response, conductivity, permittivity, and piezoelectric response. Hence, it is very crucial to characterize these properties at the nanoscale. The Atomic Force Microscopy (AFM)-based techniques are powerful tools that can simultaneously characterize morphology and electrical properties of 2D materials with high spatial resolution, thus being more and more extensively used in this research field. Here, the principles of these AFM techniques are reviewed in detail. After that, their representative applications are further demonstrated in the local characterization of various 2D materials’ electrical properties.


advanced AFM techniques nanoscale characterization electrical properties 2D materials 



This project was supported by the National Natural Science Foundation of China (NSFC) (Nos. 21622304, 61674045, and 11604063), the Ministry of Science and Technology (MOST) of China (No. 2016YFA0200700), the Strategic Priority Research Program, the Key Research Program of Frontier Sciences and Instrument Developing Project of Chinese Academy of Sciences (CAS) (Nos. XDB30000000, QYZDB-SSW-SYS031, and YZ201418), Osaka University’s International Joint Research Promotion Program (Nos. J171013014 and J171013007). Z. H. Cheng was supported by Distinguished Technical Talents Project and Youth Innovation Promotion Association CAS, the Fundamental Research Funds for the Central Universities and the Research Funds of Renmin University of China (No. 18XNLG01).


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Copyright information

© Higher Education Press and Springer-Verlag GmbH Germany, part of Springer Nature 2019

Authors and Affiliations

  • Sabir Hussain
    • 1
    • 3
  • Kunqi Xu
    • 1
  • Shili Ye
    • 1
    • 2
    • 3
  • Le Lei
    • 2
  • Xinmeng Liu
    • 2
  • Rui Xu
    • 1
    • 2
    Email author
  • Liming Xie
    • 1
  • Zhihai Cheng
    • 2
  1. 1.CAS Key Laboratory of Standardization and Measurement for Nanotechnology, CAS Center for Excellence in NanoscienceNational Center for Nanoscience and TechnologyBeijingChina
  2. 2.Department of Physics and Beijing Key Laboratory of Optoelectronic Functional Materials & Micro-nano DevicesRenmin University of ChinaBeijingChina
  3. 3.University of Chinese Academy of SciencesBeijingChina

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