Electrophysical Characteristics of the Pentacene-based MIS Structures with a SiO2 Insulator
- 13 Downloads
In a wide range of frequencies and temperatures, the admittance of MIS structures based on pentacene organic films, formed by thermal evaporation in vacuum on SiO2 and SiO2/Ga2O3 substrates, was experimentally investigated. The capacitance-voltage characteristics of MIS structures with a SiO2 insulator have virtually no hysteresis. It is shown that at temperatures of 150–300 K, an inversion layer is formed in the structures at large positive bias voltages. The concentration of holes in pentacene, determined from the capacitive measurements, exceeds 1018 cm–3 and is practically independent of temperature and frequency. The experimental frequency dependences of the admittance of MIS structures with the SiO2 insulator are in good agreement with the results of calculations performed using the method of equivalent circuits. For structures with a Ga2O3 layer, the negative differential conductance of the insulating layer was detected, which requires the complication of the equivalent circuit. The possibility of using the low-temperature admittance measurements for studying the traps in the pentacene film bulk is shown.
Keywordsorganic semiconductor pentacene MIS structure SiO2 Ga2O3 admittance equivalent circuits low-temperature measurements inversion layer bulk traps
Unable to display preview. Download preview PDF.
- 1.S. S. Sun and L. R. Dalton, Introduction to Organic Electronic and Optoelectronic Materials and Devices, Taylor & Francis, CRC Press, Boca Raton (2016).Google Scholar
- 3.E. H. Nicollian and J. R. Brews MOS (Metal Oxide Semiconductor) Physics and Technology, Wiley, New York (1982).Google Scholar
- 4.O. J. Sandberg, M. Nyman, S. Dahlström, et al., Appl. Phys. Lett., 110, No. 15, 153504 (2017).Google Scholar
- 9.I. Torres and D. M. Taylor, J. Appl. Phys., 98, No. 7, 073710 (2005).Google Scholar
- 25.V. M. Kalygina, A. N. Zarubin, E. P. Naiden, et al., Fiz. Tekh. Poluprovodn., 45, No. 8, 1130– 1135 (2011).Google Scholar
- 26.E. Bezzeccheri, A. Femia, R. Liguori, et al., Mater. Today: Proc., 4, No. 4, 5045–5052 (2017).Google Scholar
- 27.R. A Liguori, Study on Defects in Organic Semiconductors for Field Effect Transistors, Tesi di Dottorato (2014).Google Scholar