Effects of modified nano-silica on the microstructure of PVDF and its microporous membranes
- 65 Downloads
In this study, effects of modified silica on the microstructure of polyvinylidene fluoride and its microporous membranes were investigated. The silica was modified by 3-Methacryloxypropyltrimethoxysilane to improve its compatibility with the polyvinylidene fluoride matrix. The relaxation time of polyvinylidene fluoride was markedly improved by modified nano-silica, especially at the loading of 0.1 wt‰. Effects of the modified silica on the nanocomposite microstructure, such as crystallization and orientation behavior, were studied in the manuscript. Furthermore, adding 3-Methacryloxypropyltrimethoxysilane modified silica could effectively handicap the relaxation of orientation structure in polyvinylidene fluoride and facilitate the formation of uniform lamellar structures which could be described by two-dimensional small-angle X-ray scattering testing. Finally, casting films with more uniform lamellar structure was also in favor of fabricating polyvinylidene fluoride microporous membranes by melt-stretching method.
KeywordsPolyvinylidene fluoride Modified silica Crystalline microstructure Orientation Microporous membrane
The authors sincerely acknowledge the financial support of National Natural Science Foundation of China (Grant number 51721091,21674069 and 21174092).
- 10.Zhang PY, Yang H, Xu ZL, Wei YM, Guo JL, Chen DG (2013) Characterization and preparation of poly(vinylidene fluoride) (PVDF) microporous membranes with interconnected bicontinuous structures via non-solvent induced phase separation (NIPS). J Polym Res 20:1–13Google Scholar
- 16.Hu B, Cai Q, Xu R, Mo H, Chen C, Zhang F, Lei C (2015) Influence of uniaxial cold stretching followed by uniaxial hot stretching conditions on crystal transformation and microstructure in extrusion cast and annealed polyvinylidene fluoride porous membranes. J Plast Film Sheet 31:269–285CrossRefGoogle Scholar
- 48.Strobl GR (1998) The physics of polymers concepts for understanding their structures and behavior. IEEE Electr Insul Mag 206:274–276Google Scholar