Structural and Magnetic Properties of Co100−xPdx Thin Films Evaporated on Si (100) Substrate
- 42 Downloads
The structural and magnetic properties of Co100−xPdx thin films grown under vacuum by physical vapor deposition (PVD) on Si (100) are reported. The thicknesses of the samples were measured with a DEKTAK 150 profilometer; chemical composition was analyzed by energy dispersive X-ray analyses (EDX). Microscopic characterizations of the films were done with X-ray diffraction (XRD) and we conclude that all the samples were polycristalline with an hcp structure. The hysteresis loops are performed by means of vibrating sample magnetometer (VSM) and we point up that all the samples present a planar ferromagnetic anisotropy. The saturation magnetization decreases as the palladium content increases and high values of the squareness up to 0.62 were measured. All these results are analyzed and correlated.
KeywordsThin films CoPd Magnetization Coercivity X-ray diffraction
The authors warmly thank the Director of the URME of Sétif1 University, Prof. Mohamed HAMIDOUCHE and his team, as well as the Director of LCIMN laboratory, Prof. Amor AZIZI and his team, for alloying Mrs. Ahlem BOUREZG to carry out several experiments in their respective laboratories.
- 8.Eberhart, J.P.: Analyse Structurale et Chimiques des Matériaux. Bordas, Paris (1998)Google Scholar