Low power consumption UV sensor based on n-ZnO/p-Si junctions

  • Naif H. Al-HardanEmail author
  • Mohd Marzaini Mohd Rashid
  • Azlan Abdul Aziz
  • Naser M. Ahmed


We report on the manufacture of low power consumption UV sensor based on n-ZnO/p-Si Junction. The ZnO thin film was prepared through RF sputtering process. The X-ray diffraction analysis and scanning electron microscopy reveal that the prepared ZnO films exhibit single diffraction peak at a Bragg angle of approximately 34.28° with a homogeneous distribution of nanosized structures. The pn junction exhibit good rectifying behaviour with rectifying ratio of approximately 800 at ± 2 V. At zero bias voltage, the prepared UV photodiode shows the highest photo-to-dark current ratio with a stable dynamic behaviour under the illumination of 360 nm UV light. The prepared UV photodiode show dual polarity behaviour with different proposed sensing mechanisms.



The authors would like to thank the School of Physics at USM for supporting this research and providing the appropriate research environment. Our gratitude also goes to the RCMO-USM, for supporting us with the bridging grant (304.PFIZIK.6316276).


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© Springer Science+Business Media, LLC, part of Springer Nature 2019

Authors and Affiliations

  1. 1.School of PhysicsUniversiti Sains Malaysia (USM)PenangMalaysia

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