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III-Nitride-based junction devices round contacts: effect of semiconductor film geometry and characteristics on the capacitance and conductance measurements

  • Heberto Gómez PozosEmail author
  • Arturo Maldonado
  • J. I. Izpura
  • Elías Muñoz
Article
  • 36 Downloads

Abstract

A theoretical model was developed, which allows simulating the capacitance (C) and conductance/frequency (G/f) profiles as a function of operation frequencies for a round Schottky diode, and in terms of a transfer length concept, LT(jω), which depends on the electrical characteristics of AlGaN:Si semiconductor film, dimensions and structure Schottky diode. The (C) and (G/f) measurements were performed by applying a small electrical signal far away and parallel to the planar structure of junction device, due to the impossibility of accessing perpendicularly path, since the AlGaN:Si semiconductor film was deposited over a substrate of high electrical resistivity, just as it happens with the III nitrates materials. The (C) and (G/f) profiles were measured for operating frequencies ranging from 3 kHz to 1 MHz. Comparison of experimental measurements and theoretical model were analyzed. It was found that the structure Schottky and electrical characteristics of film plays an important role as a limiting factor in the (C) and (G/f) measurements at media and high operating frequencies.

Notes

Acknowledgements

The technical assistance of Elias Muñoz Merino, Ignacio Izpura and Moises Orduño-Gómez for sample preparation and characterization is thanked.

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Authors and Affiliations

  1. 1.Área Académica de Computación y Electrónica, ICBIUniversidad Autónoma del Estado de HidalgoHidalgoMexico
  2. 2.Departamento de Ingeniería Eléctrica-SEES, Centro de Investigación y de Estudios Avanzados del Instituto Politécnico NacionalCINVESTAV-IPNMexicoMexico
  3. 3.Departamento de Ingeniería Electrónica, ETSI, TelecomunicaciónUniversidad Politécnica de MadridMadridSpain

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