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Crystallization evolution and ferroelectric behavior of Bi3.25La0.75Ti3O12-based thin films prepared by rf-magnetron sputtering

  • Shuai Ma
  • Xingwang ChengEmail author
  • Tayyeb Ali
  • Zhaolong Ma
  • Zhijun XuEmail author
  • Ruiqing Chu
Article
  • 21 Downloads

Abstract

Ta-doped Bi3.25La0.75Ti3O12 (BLTT) ferroelectric thin films were prepared via rf-magnetron sputtering with subsequent annealing treatments. The crystallization evolution and ferroelectric behavior of BLTT thin films were studied using in situ high temperature X-ray diffraction, scanning electron microscopy (SEM), atomic force microscopy (AFM) and piezoresponse force microscopy (PFM). With the increase of annealing temperatures, the thin films exhibited a preferred 〈117〉 crystalline orientation first and then weakly crystallizations to c-axis were obtained at high temperatures. SEM analysis reveals that the grain growth might be performed by melting and combining of particles in surface layer of original grains. PFM phase images reveal that less domain switching could be induced for BLTT films with larger grains.

Notes

Acknowledgments

This work was supported by the National Natural Science Foundation of China (No. 51271036), National Key R&D Program of China (No. 2016YFB0402701). Focus on research and development plan in Shandong province (No. 2017GGX202008).

References

  1. 1.
    C. Long, Q. Chang, H. Fan, Sci. Rep. UK 7, 4193 (2017)CrossRefGoogle Scholar
  2. 2.
    J.F. Scott, Science 315, 954 (2007)CrossRefGoogle Scholar
  3. 3.
    N. Setter, D. Damjanovic, L. Eng et al., J. Appl. Phys. 100, 051606 (2006)CrossRefGoogle Scholar
  4. 4.
    F. Yakuphanoglu, A. Tataroğlu, A.A. Al-Ghamdi et al., Mater. Sol. C. 133, 69 (2015)CrossRefGoogle Scholar
  5. 5.
    Y. Zhao, H. Fan, X. Ren et al., J. Mater. Chem. C 4, 7324 (2016)CrossRefGoogle Scholar
  6. 6.
    C. Long, H. Fan, M. Li et al., Scr. Mater. 75, 70 (2014)CrossRefGoogle Scholar
  7. 7.
    B.H. Park, B.S. Kang, S.D. Bu et al., Nature 401, 682 (1999)CrossRefGoogle Scholar
  8. 8.
    Y. Shimakawa, Y. Kubo, Y. Tauchi et al., Appl. Phys. Lett. 79, 2791 (2001)CrossRefGoogle Scholar
  9. 9.
    M. Kao, H. Chen, S. Young, Thin Solid Films 529, 143 (2013)CrossRefGoogle Scholar
  10. 10.
    J. Chen, Q. Yun, W. Gao et al., Mater. Lett. 136, 11 (2014)CrossRefGoogle Scholar
  11. 11.
    H.N. Lee, D. Hesse, N. Zakharov et al., Science 296, 2006 (2002)CrossRefGoogle Scholar
  12. 12.
    C. Xue, X. Sun, Y. Zhang et al., Ceram. Int. 43, 8459 (2017)CrossRefGoogle Scholar
  13. 13.
    C.J. Lu, Y. Qiao, Y.J. Qi et al., Appl. Phys. Lett. 87, 222901 (2005)CrossRefGoogle Scholar
  14. 14.
    F. Hou, M. Shen, Mater. Sci. Eng. B 122, 164 (2005)CrossRefGoogle Scholar
  15. 15.
    B. Yang, D. Zhang, B. Zhou et al., J. Cryst. Growth 310, 4511 (2008)CrossRefGoogle Scholar
  16. 16.
    S. Ma, X. Cheng, Z. Ma et al., Solid State Commun. 278, 31 (2018)CrossRefGoogle Scholar
  17. 17.
    Y. Wu, D. Zhang, J. Yu et al., J. Am. Ceram. Soc. 92, 501 (2009)CrossRefGoogle Scholar
  18. 18.
    D. Coathup, Z. Li, X. Zhu et al., Mater. Lett. 206, 117 (2017)CrossRefGoogle Scholar
  19. 19.
    S. Ma, X. Cheng, J. Hao et al., Ceram. Int. 43, 13193 (2017)CrossRefGoogle Scholar
  20. 20.
    A. Wu, M.R. Soares, I.M. Salvado et al., Mater. Res. Bull. 47, 3819 (2012)CrossRefGoogle Scholar
  21. 21.
    R.W. Schwartz, Chem. Mater. 9, 2325 (1997)CrossRefGoogle Scholar
  22. 22.
    R.W. Schwartz, J.A. Voigt, B.A. Tuttle et al., J. Mater. Res. 12, 444 (1997)CrossRefGoogle Scholar
  23. 23.
    Y.M. Sun, Y.C. Chen, J.Y. Gan et al., Jpn. J. Appl. Phys. 41, 892 (2002)CrossRefGoogle Scholar
  24. 24.
    S.B. Desu, D.P. Vijav, Mater. Sci. Eng., B 32, 83 (1995)CrossRefGoogle Scholar
  25. 25.
    J.H. Choi, J.Y. Lee, Y.T. Kim, Appl. Phys. Lett. 74, 2933 (1999)CrossRefGoogle Scholar
  26. 26.
    Y.C. Chen, Y.M. Sun, C.P. Lin et al., J. Crystal. Growth. 268, 210 (2004)CrossRefGoogle Scholar
  27. 27.
    M. Zhang, K. Wang, Y. Du et al., J. Am. Chem. Soc. 139, 3889 (2017)CrossRefGoogle Scholar

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© Springer Science+Business Media, LLC, part of Springer Nature 2019

Authors and Affiliations

  1. 1.School of Materials Science and EngineeringBeijing Institute of TechnologyBeijingChina
  2. 2.National Key Laboratory of Science and Technology on Materials Under Shock and ImpactBeijingChina
  3. 3.School of Environment and Materials EngineeringYantai UniversityYantaiChina

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