Amorphization kinetics in strontium titanate at 16 and 300 K under argon ion irradiation
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The accumulation of irradiation-induced disorder in SrTiO3 single crystals irradiated at 16 K with 200 keV Ar ions has been investigated using Rutherford backscattering spectrometry along the 〈100〉 channeling direction and compared with previous results obtained at 300 K under identical irradiation conditions. As expected, amorphization at 16 K occurs at a much lower fluence than at 300 K due to dynamic recovery of irradiation-induced defects at 300 K. Utilizing a comprehensive damage accumulation model for analysis of the data, irradiation at 16 K results only in the formation of point defects and amorphous pockets, while defect clusters are also formed at 300 K. High defect mobility under irradiation at 300 K tends to promote recombination and clustering of point defects. These results suggest that defect diffusion processes in SrTiO3 are not thermally active at 16 K.
This work was supported by the US Department of Energy, Office of Science, Basic Energy Sciences, Materials Sciences and Engineering Division under Contract Number DE-AC05-00OR22725. The work was also supported by the BMBF of Germany under Contract Number 03SF0478B. The authors gratefully acknowledge the staff of the ion beam center facility at the Friedrich-Schiller Universität Jena for their assistance during ion irradiation and ion channeling experiments.
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