Journal of Materials Science

, Volume 44, Issue 19, pp 5182–5188 | Cite as

Nanoscale insight into the statics and dynamics of polarization behavior in thin film ferroelectric capacitors

  • A. GruvermanEmail author


In this study, we review recent advances in PFM studies of micrometer scale ferroelectric capacitors, summarize the experimental PFM-based approach to investigation of fast switching processes, illustrate what information can be obtained from PFM experiments on domains kinetics, and delineate the scaling effect on polarization reversal mechanism. Particular attention is given to PFM studies of mechanical stress effect on polarization stability.


Domain Wall Domain Wall Motion Wall Velocity Piezoresponse Force Microscopy Domain Wall Velocity 



This study was supported by the National Science Foundation (Grant Nos. MRSEC DMR-0820521) and the Nebraska Center for Materials and Nanoscience at University of Nebraska-Lincoln. The author would like to thank Prof. T. W. Noh for his kind permission to use his data.


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Copyright information

© Springer Science+Business Media, LLC 2009

Authors and Affiliations

  1. 1.Department of Physics and AstronomyUniversity of NebraskaLincolnUSA

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