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Journal of Materials Science

, Volume 44, Issue 13, pp 3457–3461 | Cite as

Synthesis, growth and structural perfection of nonlinear optical material of glycine hydrofluoride (GHF)

  • N. VijayanEmail author
  • G. Bhagavannarayana
  • S. N. Sharma
  • Subhasis Das
Article

Abstract

In the present communication, we have successfully synthesized the efficient NLO material of glycine hydrofluoride (GHF) by conventional chemical reaction, and grown the single crystal by adopting slow evaporation solution growth technique. In order to know its suitability for device fabrication, different characterization analyses have been performed. The lattice constants have been determined from powder X-ray diffraction (PXRD) method and found that it crystallizes in orthorhombic crystal system. Its crystalline perfection was evaluated by high-resolution X-ray diffraction technique (HRXRD) and the value of FWHM indicates the presence of low angle structural grain boundaries. Its luminescence behaviour has been analysed by photoluminescence (PL) analysis and found maximum luminescence in the lower wavelength region. Its relative second harmonic generation efficiency was evaluated from Kurtz powder technique. The phase matching angle of GHF was determined by using Nd:YAG laser as a source. Its thermal, mechanical and electrical properties were examined by TG/DTA, Vickers microhardness tester and dielectric measurements, respectively.

Keywords

Nonlinear Optical Material Vickers Hardness Number Crystalline Perfection Laser Damage Threshold Orthorhombic Crystal System 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

Notes

Acknowledgements

The authors NV and GBN are very much thankful to Prof. Vikram Kumar, Director, NPL, and B. R. Chakraborty, Head, Materials Characterization Division, for their kind support. One of the authors NV is grateful to Dr. S. K. Halder and Dr. S. K. Dhawan for extending the Powder XRD and TG/DTA facilities. The authors also gratefully acknowledge the technical helps of Dr S. K. Pradhan and Dr M. Pal of Burdwan University.

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Copyright information

© Springer Science+Business Media, LLC 2009

Authors and Affiliations

  • N. Vijayan
    • 1
    • 2
    • 5
    Email author
  • G. Bhagavannarayana
    • 1
  • S. N. Sharma
    • 3
  • Subhasis Das
    • 4
  1. 1.Materials Characterization DivisionNational Physical LaboratoryNew DelhiIndia
  2. 2.Dpto. Física de Materiales, Facultad de CienciasUniversidad Autónoma de MadridMadridSpain
  3. 3.Electronic Materials DivisionNational Physical LaboratoryNew DelhiIndia
  4. 4.Department of PhysicsUniversity of BurdwanBardhamanIndia
  5. 5.Crystal Growth and Crystallography SectionNational Physical LaboratoryNew DelhiIndia

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