Journal of Materials Science

, Volume 43, Issue 21, pp 6848–6852 | Cite as

X-ray diffraction and compositional studies of AgInS2 thin films obtained by spray pyrolysis

  • M. Calixto-Rodriguez
  • A. Tiburcio-SilverEmail author
  • A. Sanchez-Juarez
  • M. E. Calixto


Silver indium sulfide (AgInS2) thin films have been prepared by the spray pyrolysis technique using silver acetate, indium acetate, and N,N-dimethylthiourea as precursor compounds. Depending on the film preparation conditions, AgInS2 thin films are obtained which could be candidates to be used in photovoltaic devices. X-ray diffraction (XRD) and energy dispersive spectroscopy (EDS) compositional studies were done on films formed at different substrate temperatures (Ts) and Ag:In:S ratios in the starting solutions. When Ag:In:S ratios are 1:1:1, 1:0.25:2, and 1:1:2, XRD patterns of the thin films indicated that the crystallographic structure is mainly chalcopyrite AgInS2. An additional phase, acanthite Ag2S, appeared when the depositions where done at low Ts. EDS analysis showed that AgInS2 films near stoichiometric composition were obtained by using an atomic ratio of Ag:In:S = 1:1:2 in the starting solution and Ts = 400 °C.


Chalcopyrite Spray Pyrolysis Ag2S Energy Dispersive Spectroscopy Analysis Indium Content 



The authors would like to thank Dra. Hilda Esperanza Esparza Ponce (CIMAV-Chihuahua) for EDS analysis, M.C. Ma. Luisa Ramón for XRD analysis, and Ing. J. Ortega-Cruz for technical assistance in the electrical measurements. The authors are grateful to DGAPA-UNAM (project IN 111506) for the financial support.


  1. 1.
    Shay JL, Tell B, Schiavone LM, Kasper HM, Thiel F (1974) Phys Rev B 9:1719. doi: CrossRefGoogle Scholar
  2. 2.
    Roth RS, Parker HS, Brower WS (1973) Mater Res Bull 8:333. doi: CrossRefGoogle Scholar
  3. 3.
    Loferski JJ, Shewchun J, Roessler B, Beaulieu R, Piekoszeuski J, Gorska M et al (1997) In: Proc. 13th IEEE PV Special. Conf., 1997, p 341Google Scholar
  4. 4.
    Okamoto K, Kinoshita K (1976) Solid-State Electron 19:31CrossRefGoogle Scholar
  5. 5.
    Yoshino K, Komaki H, Kakeno T, Akaki Y, Ikari T (2003) J Phys Chem Solids 64:1839. doi: CrossRefGoogle Scholar
  6. 6.
    Yoshino K, Mitani N, Sugiyama M, Cichibu SF, Komaki H, Ikari T (2001) Physica B 302–303:349. doi: CrossRefGoogle Scholar
  7. 7.
    Akaki Y, Kurihara S, Shirama M, Tsurugida K, Seto S, Kakeno T et al (2005) J Phys Chem Solids 66:1858. doi: CrossRefGoogle Scholar
  8. 8.
    You SH, Hong KJ, Lee BJ, Jeong TS, Youn CJ, Park JS et al (2002) J Cryst Growth 245:261. doi: CrossRefGoogle Scholar
  9. 9.
    Hong KJ, Jeong JW, Jeong TS, Youn CJ, Lee WS, Park JS et al (2003) J Phys Chem Solids 64:1119. doi: CrossRefGoogle Scholar
  10. 10.
    Gorska M, Beaulieu R, Lofersky JJ, Roessler B (1980) Thin Solid Films 67:341. doi: CrossRefGoogle Scholar
  11. 11.
    Ortega-López M, Morales-Acevedo A, Solorza-Feria O (2001) Thin Solid Films 385:120. doi: CrossRefGoogle Scholar
  12. 12.
    Albor Aguilera ML, Ortega-López M, Sánchez Resendiz VM, Aguilar Hernández J, González Trujillo MA (2003) Mater Sci Eng B 102:380. doi: CrossRefGoogle Scholar
  13. 13.
    Calixto-Rodriguez M, Tiburcio-Silver A, Ortiz A, Sánchez-Juarez A (2005) Thin Solid Films 480–481:133. doi: CrossRefGoogle Scholar
  14. 14.
    Sánchez Juárez A (1995) MSc thesis, Facultad de Ciencias-UNAM, MéxicoGoogle Scholar
  15. 15.
    Ortega-López M, Vigil-Galán O, Cruz Gandarilla F, Solorza-Feria O (2003) Mater Res Bull 38:55. doi: CrossRefGoogle Scholar

Copyright information

© Springer Science+Business Media, LLC 2008

Authors and Affiliations

  • M. Calixto-Rodriguez
    • 1
  • A. Tiburcio-Silver
    • 2
    Email author
  • A. Sanchez-Juarez
    • 1
  • M. E. Calixto
    • 3
  1. 1.Centro de Investigación en EnergíaUniversidad Nacional Autónoma de MéxicoTemixcoMexico
  2. 2.Instituto Tecnológico de Toluca-SEPMetepecMexico
  3. 3.CuernavacaMexico

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