Advanced Materials and Characterization: Proceedings of the Brandon Symposium
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This Open image in new window Special Issue is a collection of papers, based on the invited lectures presented at The Brandon Symposium: Advanced Materials and Characterization, held within the framework of the 2006 TMS Annual Meeting & Exhibition, March 12–16, 2006, San Antonio, Texas, USA. The Brandon Symposium and the papers within this Special Issue are in honor of David Brandon’s 70th birthday, and his unique contribution to Materials Science over the course of his rich academic career.
David Brandon was born on January 14, 1935 in England. After completing his undergraduate studies in 1959, he continued at Cambridge as a PhD candidate in Jack Nutting’s electron microscopy research group. This was an exciting period of time at Cambridge, with discussions with eminent scientists such as Neville Mott, Max Perutz, and Peter Hirsch, and visits by Alfred Seeger, Charles Frank and Jacques Friedel. Under Nutting, David worked with Robin Nicholson and Gareth Thomas on transmission...