Advertisement

Journal of Materials Science

, Volume 41, Issue 17, pp 5619–5624 | Cite as

Correlation between optical, electrical and structural properties of vanadium dioxide thin films

  • N. R. Mlyuka
  • R. T. Kivaisi
Article

Abstract

VO2 films have been prepared on normal microscope glass slides by reactive rf magnetron sputtering of vanadium target in a mixture of argon and oxygen. Optical properties of the films were investigated by the UV/Vis/NIR Perkin–Elmer Lamda 9. Transmission electron microscope and atomic force microscope were used to investigate the structure of the films. Correlation between structural and optical properties of VO2 thin films is investigated with respect to the dependence of both to substrate temperature.

Keywords

Deposition Temperature Rutherford Backscatter Spectroscopy Vanadium Dioxide Hysteresis Width Transmission Electron Microscope Microstructure 

Notes

Acknowledgment

Mlyuka, N. R. would like to thank the University of Dar es Salaam for scholarship. IPPS, Uppsala University, Sweden is also acknowledge for support including research equipment and materials.

References

  1. 1.
    Morin FJ, (1959) Phys Rev Lett 3:34CrossRefGoogle Scholar
  2. 2.
    Sobhan MA, Kivaisi RT, Stjerna B, Granqvist CG, (1996) Sol Energy Mater Sol Cells 44:451CrossRefGoogle Scholar
  3. 3.
    Granqvist CG (1991) In: Granqvist CG (ed) Energy efficient windows: present and forthcoming technology, Pergamon, OxfordGoogle Scholar
  4. 4.
    Ilinski A, Silva-Andrade F, Shadrin E, Klimov V, (2004) J Non-Cryst Solids 338(340):266CrossRefGoogle Scholar
  5. 5.
    Babulanam SM, Eriksson TS, Niklasson GA, Granqvist CG, (1986) SPIE 692:007Google Scholar
  6. 6.
    Petit C, Frigerio J, Goldman M, (1999) J Phy: Condens Matter 11:3259Google Scholar
  7. 7.
    Jin P, Yoshimura K, Tanemura S, (1997) J Vac Sci Technol A 15(3):1113CrossRefGoogle Scholar
  8. 8.
    Sobhan MA, Kivaisi RT, Stjerna B, Granqvist CG, (1994) SPIE 2255:423Google Scholar
  9. 9.
    Begishev AR, Galiev GB, Ignat’ev AS, Mokerov VG, Poshin VG, (1978) Sov Phys Solid State 20(6):951Google Scholar
  10. 10.
    Burkhardt BW, Christmann T, Franke S, Kriegseis W, Meister D, Meyer BK, Niessner W, Schalch D, Scharmann A, (2002) Thin Solid Films 402:226CrossRefGoogle Scholar
  11. 11.
    Samiji ME (1997) Preparation and characterization of vanadium dioxide films M.Sc. Dissertation, University of Dar es salaamGoogle Scholar
  12. 12.
    Stephanovich G, Pergament A, Stephanovich D, (2000) J Phys Condens Matter 12:8837CrossRefGoogle Scholar
  13. 13.
    Denatale JF, Hood PJ, Harker AB. (1989) J Appl Phys 66(12):5844CrossRefGoogle Scholar
  14. 14.
    Roach WR, (1971) Appl Phys Lett 19(11):453CrossRefGoogle Scholar
  15. 15.
    Buhling B, Michalowski L, (1976) LE VIDE 185:185Google Scholar
  16. 16.
    Cui J, Da D, Jiang W, (1998) Appl Surface Sci 133:225CrossRefGoogle Scholar
  17. 17.
    Kusano E, Theil JA, (1989) J Vac Sci Technol A 7(3):1314CrossRefGoogle Scholar
  18. 18.
    Thornton JA, (1974) J Vac Sci Tech 11(4):666CrossRefGoogle Scholar
  19. 19.
    Thornton JA, (1975) J Vac Sci Tech 12(4):830CrossRefGoogle Scholar
  20. 20.
    Thornton JA, (1986) J Vac Sci Tech A 4(6):359CrossRefGoogle Scholar
  21. 21.
    Ambia MG, Islam MN, Hakim MO, (1992) Sol Energy Mater Solar Cells 28(2):103CrossRefGoogle Scholar

Copyright information

© Springer Science+Business Media, LLC 2006

Authors and Affiliations

  1. 1.Solar Energy Group, Physics DepartmentUniversity of Dar es salaamDar es salaamTanzania

Personalised recommendations