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Journal of Materials Science

, Volume 41, Issue 14, pp 4445–4453 | Cite as

Electron microscope weak-beam imaging of stacking fault tetrahedra: observations and simulations

  • M. L. JenkinsEmail author
  • Z. Zhou
  • S. L. Dudarev
  • A. P. Sutton
  • M. A. Kirk
Article

Abstract

Weak-beam diffraction-contrast electron microscope images of stacking-fault tetrahedra (SFT) have been simulated by solving numerically the Howie–Basinski equations, which are well suited for studying the dependence of image contrast on experimental parameters. These simulated images are in good qualitative agreement with experimental transmission electron micrographs. The visibility of small SFT and the relationship between measured image sizes and real SFT sizes are discussed.

Keywords

Deviation Parameter Foil Thickness Diffraction Vector Defect Depth Diffraction Condition 

Notes

Acknowledgements

ZZ is grateful to the EURATOM/UKAEA Fusion Association for the provision of a studentship.

He is also grateful to St Hugh’s College for the award of a Wei Lun Scholarship. Work at UKAEA

was funded by EPSRC and EURATOM.

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Copyright information

© Springer Science+Business Media, LLC 2006

Authors and Affiliations

  • M. L. Jenkins
    • 1
    Email author
  • Z. Zhou
    • 1
  • S. L. Dudarev
    • 2
  • A. P. Sutton
    • 3
  • M. A. Kirk
    • 4
  1. 1.Department of MaterialsUniversity of OxfordOxfordUK
  2. 2.EURATOM/UKAEA Fusion AssociationCulham Science CentreOxfordshireUK
  3. 3.Department of PhysicsImperial CollegeLondonUK
  4. 4.Materials Science DivisionArgonne National LaboratoryArgonneUSA

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