Measurement of Directional Spectral Emissivity at High Temperatures
- 140 Downloads
Emissivity is a significant parameter to describe the thermal radiation characteristics of the objects. It has important applications in thermal control of spacecrafts, highly efficient use of solar energy, buildings’ energy insulation and saving, and so on. Besides, more attention is attached to selective control of thermal emission by using micro-/nanostructures. In this work, to measure directional spectral emissivity, a measurement facility is developed which includes a sample heater with temperature control, a blackbody source, mirror assembly and a Fourier transform infrared spectrometer with different detectors. A sample heater is designed, and by using ceramic electric heaters, samples can be heated up to 1400 K at a high heating speed. And a new kind of water-cooled surface of the sample heating unit is designed to reduce the error by reducing the thermal radiation from surface of the heating unit so that measurement accuracy is improved. An electro-controlling rotating stage is adopted, and measuring angle is up to 60°. A SiC wafer is used as the reference to test the directional spectral emissivity measurement facility, and uncertainty is estimated.
KeywordsDirectional emissivity High temperatures Measurement Spectra
This work was supported by the National Natural Science Foundation of China (No. 51522601), the Chang Jiang Young Scholars Program of China (No. Q2016186) and the Program for New Century Excellent Talents in University (No. NCET-13-0173). Special thanks are given to the reviewers and people who suggest improvements in the experiment and the manuscript.
- 1.Z.M. Zhang, Nano/Microscale Heat Transfer (McGraw-Hill, NewYork, 2007)Google Scholar
- 2.R. Siegel, J.R. Howell, Thermal Radiation Heat Transfer (Taylor & Francis, NewYork, 2002)Google Scholar
- 13.S. Bharadwaj, M. Modest, R. Riazzi, in ASME Heat Transfer Summer Conference, San Francisco, 2005, pp. 374–381Google Scholar
- 14.A.V. Prokhorov, L.M. Hanssen, S.N. Mekhontsev, in Conference on Thermosense XXVII, Kissimmee, 2006, pp. 620505Google Scholar
- 15.S.G. Kaplan, L.M. Hanssen, E.A. Early, M.E. Nadal, in Conference on Optical Diagnostic Methods for Inorganic Materials II, San Diego, 2000, ed. by L.M. Hanssen, pp. 53–61Google Scholar
- 16.L.M. Hanssen, S.N. Mekhontsev, V.B. Khromchenko, in Conference on Thermosense XXVI, Orlando, 2004, ed. by D. Burleigh, K. Cramer, G. Peacock, pp. 1–12Google Scholar
- 17.L.M. Hanssen, S.G. Kaplan, in 4th Oxford Conference on Spectroscopy, Davidson, 2003, ed. by A. Springsteen, M. Pointer, pp. 21–26Google Scholar
- 18.J. Ishii, A. Ono, in Conference on Optical Diagnostic Methods for Inorganic Materials II, San Diego, 2000, ed. by L.M. Hanssen, pp. 126–132Google Scholar
- 24.L. Ibos, J.-P. Monchau, V. Feuillet, J. Dumoulin, P. Ausset, J. Hameury, B. Hay, in 13th Quantitative Infrared Thermography Conference, Gdansk, 2016, pp. 244–250Google Scholar