Onsite Calibration of a Precision IPRT Based on Gallium and Gallium-Based Small-Size Eutectic Points

  • Jianping SunEmail author
  • Xiaopeng Hao
  • Fanchao Zeng
  • Lin Zhang
  • Xinyun Fang
Part of the following topical collections:
  1. TEMPMEKO 2016: Selected Papers of the 13th International Symposium on Temperature, Humidity, Moisture and Thermal Measurements in Industry and Science


Onsite thermometer calibration with temperature scale transfer technology based on fixed points can effectively improve the level of industrial temperature measurement and calibration. The present work performs an onsite calibration of a precision industrial platinum resistance thermometer near room temperature. The calibration is based on a series of small-size eutectic points, including Ga–In (\(15.7 \,{^{\circ }}\hbox {C}\)), Ga–Sn (\(20.5 \,{^{\circ }} \hbox {C}\)), Ga–Zn (\(25.2 \,{^{\circ }} \hbox {C}\)), and a Ga fixed point (\(29.7 \,{^{\circ }} \hbox {C}\)), developed in a portable multi-point automatic realization apparatus. The temperature plateaus of the Ga–In, Ga–Sn, and Ga–Zn eutectic points and the Ga fixed point last for longer than 2 h, and their reproducibility was better than 5 mK. The device is suitable for calibrating non-detachable temperature sensors in advanced environmental laboratories and industrial fields.


Gallium-based eutectic points Industrial platinum resistance thermometer Multi-point Onsite calibration 



This work was supported by the National Natural Science Foundation of China (Nos. 51576181, 11475162) and National High-Tech R&D Program (863 Program No. 2015AA123701).


  1. 1.
    G. Ohring, B. Wielicki, R. Spencer, B. Emery, R. Datla, Bull. Am. Meteorol. Soc. 86, 1303 (2005)ADSCrossRefGoogle Scholar
  2. 2.
    H. Preston-Thomas, Metrologia 27, 3 (1990)ADSCrossRefGoogle Scholar
  3. 3.
    A. Burdakin, B. Khlevnoy, M. Samoylov, V. Sapritsky, S. Ogarev, A. Panfilov, S. Prokhorenko, Int. J. Thermophys. 30, 20 (2009)ADSCrossRefGoogle Scholar
  4. 4.
    N. Lyakishev, Phase Diagrams of Bi-metal Systems (Chemical Industry Press, Beijing, 2009), pp. 630–660Google Scholar
  5. 5.
    J. Ancsin, Metrologia 44, 87 (2007)ADSCrossRefGoogle Scholar
  6. 6.
    J.P. Sun, J.T. Zhang, P. Qiu, in Proceedings of Ninth International Temperature Symposium (Los Angeles), Temperature: Its Measurement and Control, in Science and Industry, vol 8, ed. by D.C. Ripple, AIP Conference Proceedings 1552 (AIP, Melville, NY, 2013), pp. 277–282Google Scholar
  7. 7.
    X.P. Hao, J.P. Sun, C.Y. Xu, P. Wen, J. Song, M. Xu, L.Y. Gong, L. Ding, in Proceedings of TEMPMEKO 2016, XIII International Symposium on Temperature and Thermal Measurements in Industry and Science, ed. by A. Kowal (Zakopane, Poland, 2016), pp. 106–107Google Scholar

Copyright information

© Springer Science+Business Media New York 2017

Authors and Affiliations

  1. 1.National Institute of MetrologyBeijingChina
  2. 2.Hubei Institute of Measurement and Testing TechnologyWuhanChina
  3. 3.Qingdao Institute of Measurement TechnologyQingdaoChina
  4. 4.Suzhou Institute of Measurement and Testing TechnologySuzhouChina

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