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Quantitative trait locus analysis of wheat quality traits

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Abstract

Milling and baking quality traits in wheat (Triticum aestivum L.) were studied by QTL analysis in the ITMI population, a set of 114 recombinant inbred lines (RILs) generated from a synthetic-hexaploid (W7985) × bread-wheat (Opata 85) cross. Grain from RILs grown in U.S., French, and Mexican wheat-growing regions was assayed for kernel-texture traits, protein concentration and quality, and dough strength and mixing traits. Only kernel-texture traits showed similar genetic control in all environments, with Opata ha alleles at the hardness locus Ha on chromosome arm 5DS increasing grain hardness, alkaline water retention capacity, and flour yield. Dough strength was most strongly influenced by Opata alleles at 5DS loci near or identical to Ha. Grain protein concentration was associated not with high-molecular-weight glutenin loci but most consistently with the Gli-D2 gliadin locus on chromosome arm 6DS. In Mexican-grown material, a 2DS locus near photoperiod-sensitivity gene Ppd1 accounted for 25% of variation in protein, with the ppd1-coupled allele associated with higher (1.1%) protein concentration. Mixogram traits showed most influence from chromosomal regions containing gliadin or low-molecular-weight glutenin loci on chromosome arms 1AS, 1BS, and 6DS, with the synthetic hexaploid contributing favorable alleles.

Some RI lines showed quality values consistently superior to those of the parental material, suggesting the potential of further evaluating new combinations of alleles from diploid and tetraploid relatives, especially alleles of known storage proteins, for improvement of quality traits in wheat cultivars.

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Abbreviations

AWRC:

alkaline water retention capacity

H(L)MW:

high(low)-molecular-weight

ITMI:

International Triticeae Mapping Initiative

PAGE:

polyacrylamide gel electrophoresis

RIL:

recombinant inbred line

RFLP:

restriction fragment length polymorphism

RI:

recombinant inbred

SDS:

sodium dodecyl sulfate

NIR:

near-infrared reflectance

SE:

softness equivalent

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Authors and Affiliations

  1. Department of Plant Pathology, Kansas State University, 4024 Throckmorton Hall, Manhattan, KS, 66506, USA

    James C. Nelson & Cristina Andreescu

  2. US Department of Agriculture, Agricultural Research Service, Soft Wheat Regional Quality Laboratory, Ohio Agricultural Research and Development Center, Ohio State University, 1680 Madison Ave., Wooster, OH, 44691, USA

    Patrick L. Finney, Daisy G. Gualberto & Christine J. Bergman

  3. Department of Plant Breeding and Genetics, Cornell University, 240 Emerson Hall, Ithaca, NY, 14853, USA

    Flavio Breseghello & Mark E. Sorrells

  4. International Maize and Wheat Improvement Center (CIMMYT, Int.), Apartado Postal 6-641, Delegación Cuauhtémoc, 06600, Mexico, D.F. Mexico

    Roberto J. Peña

  5. UMR 1095 INRA-UBP Amélioration & Santé des Plantes, 234 Avenue du Brézet, F-63100, Clermont-Ferrand, France

    Marie Reine Perretant & Philippe Leroy

  6. Genetic Resources Conservation Program, University of California, One Shields Avenue, Davis, California, 95616-8602, U.S.A.

    Calvin O. Qualset

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  1. James C. Nelson
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  2. Cristina Andreescu
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  3. Flavio Breseghello
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Contribution number 06-77J from the Kansas Agricultural Experimental Station.

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Nelson, J.C., Andreescu, C., Breseghello, F. et al. Quantitative trait locus analysis of wheat quality traits. Euphytica 149, 145–159 (2006). https://doi.org/10.1007/s10681-005-9062-7

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