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Applied Physics B

, 125:118 | Cite as

Probe separation and noise suppression in lensless microscopy

  • Diyi Liu
  • Yicheng Li
  • Anwar Hussain
  • Yinxu Bian
  • Cuifang KuangEmail author
  • Xu Liu
Article
  • 71 Downloads

Abstract

Lensless microscopy enables the recording of the image without the help of lens. However, it suffers from the undesired noise when the illumination is not uniform. Here, we present a novel technique to reconstruct both the illumination profile and the object in lensless microscopy based on what we call “separation method”. In this method, the background noise is separated and eliminated from the object and the quality of the image is improved. As a proof of this technique, we have done numerical simulation. The results indicate that the method has a promising potential in the suppression of noise under the situation of irregular illumination in lensless microscopy and also enables the retrieval of the incident wave field, which is of great importance as well as in electron and X-ray imaging.

Notes

Acknowledgements

This work is supported by National Basic Research Program of China (973Program) (2015CB352003); National Natural Science Foundation of China (NSFC) (6171101129, 61735017, 61335003, 61427818); Natural Science Foundation of Zhejiang province (LR16F050001); and the Fundamental Research Funds for the Central Universities (2017FZA5004).

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Copyright information

© Springer-Verlag GmbH Germany, part of Springer Nature 2019

Authors and Affiliations

  • Diyi Liu
    • 1
  • Yicheng Li
    • 1
  • Anwar Hussain
    • 1
    • 2
  • Yinxu Bian
    • 1
  • Cuifang Kuang
    • 1
    • 3
    Email author
  • Xu Liu
    • 1
    • 3
  1. 1.State Key Laboratory of Modern Optical Instrumentation, Department of Optical EngineeringZhejiang UniversityHangzhouChina
  2. 2.Quantum Optics Lab, Department of PhysicsCOMSATS University IslamabadIslamabadPakistan
  3. 3.Collaborative Innovation Center of Extreme OpticsShanxi UniversityTaiyuanChina

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