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Applied Physics B

, 124:136 | Cite as

Spectral characterization of silicon photonic crystal slab using out-of-plane light coupling arrangement

  • K. V. Ummer
  • R. Vijaya
Article

Abstract

Fano resonance is analyzed by measuring the transmission and reflection from a photonic crystal slab containing a hexagonal symmetry of holes in silicon fabricated by electron beam lithography. The spectral features in the measured transmission and angle dependent reflection are in good agreement with those calculated using rigorous coupled wave analysis method (using DiffractMOD module of RSoft\(^{\mathrm {TM}}\)). This provides a convincing proof to this versatile and convenient out-of-plane measurement technique. In our photonic crystal, the quality factors measured at 1314, 1328, 1377, 1599, and 1630 nm are high and can be utilized for designing low-threshold micro-lasers and narrowband optical filters in the silicon slab platform.

Notes

Acknowledgements

K.V. Ummer thanks Ms. Suchita Yadav and Mr. Govind Kumar for their help during the experimental set-up. K.V. Ummer also thanks Dipak Rout for the technical help during the preparation of the manuscript. The fabrication work was carried out at the CeNSE, IISc Bangalore under INUP which is sponsored by DIT, MCIT, Government of India. The work was partially supported by (1) IRDE, Dehradun, India under the DRDO Nanophotonics program (ST-12/IRD-124), (2) DST, India under the India-Taiwan S&T co-operation project (GITA/DST/TWN/P-61/2014) and (3) SERB (EMR/2015/001450).

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Copyright information

© Springer-Verlag GmbH Germany, part of Springer Nature 2018

Authors and Affiliations

  1. 1.Department of PhysicsIndian Institute of Technology KanpurKanpurIndia
  2. 2.Centre for Lasers and PhotonicsIndian Institute of Technology KanpurKanpurIndia

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