Applied Physics A

, 125:690 | Cite as

Local melting of Au/Ni thin films irradiated by femtosecond laser through GaN

  • Tatsuya OkadaEmail author
  • Takuro Tomita
  • Hiroyuki Katayama
  • Yuki Fuchikami
  • Tomoyuki Ueki
  • Hiromu Hisazawa
  • Yasuhiro Tanaka
Rapid communication


We found appropriate femtosecond laser irradiation conditions to locally melt Au/Ni double-layered thin films deposited on a GaN layer. The laser irradiation of the Au/Ni films was carried out through GaN and transmission electron microscopy revealed that GaN acted as a tough window to introduce laser pulses without suffering laser-induced damages. The Au/Ni double-layered thin films melted along the laser-irradiation lines and re-solidified into coarse particles containing an Au–Ni solid solution phase. On the other hand, in the area between laser-modified regions, the Au/Ni thin films retained the same morphology as the as-deposited state. The transition from the melted region to the unaffected area occurred in a narrow intermediate region. The present results show a possibility of a novel technique to site-specifically melt thin films to form a solid solution phase by femtosecond laser irradiation.



This work was partly supported by the Advanced Characterization Platform of the Nanotechnology Platform Japan sponsored by the Ministry of Education, Culture, Sports, Science, and Technology (MEXT). We are grateful to Mr. Hiroshi Maeno of Kyushu University for his helpful support in transmission electron microscopy. Financial support from JSPS KAKENHI (Grant numbers 17H03147 and 17H05340) is also acknowledged.


  1. 1.
    S. Kawata, H. Sun, T. Tanaka, K. Takada, Nature 412, 697 (2001)ADSCrossRefGoogle Scholar
  2. 2.
    A. Marcinkevičius, S. Juodkazis, M. Watanabe, M. Miwa, S. Matsuo, H. Misawa, J. Nishii, Opt. Lett. 26, 277 (2001)ADSCrossRefGoogle Scholar
  3. 3.
    Y. Shimotsuma, P.G. Kazansky, J. Qiu, K. Hirao, Phys. Rev. Lett. 91, 247405 (2003)ADSCrossRefGoogle Scholar
  4. 4.
    T. Gorelik, M. Will, S. Nolte, A. Tunenermann, U. Glatzel, Appl. Phys. A 76, 309 (2003)ADSCrossRefGoogle Scholar
  5. 5.
    V.R. Bhardwaj, E. Simova, P.P. Rajeev, C. Hnatovsky, R.S. Taylor, D.M. Rayner, P.B. Corkum, Phys. Rev. Lett. 96, 057404 (2006)ADSCrossRefGoogle Scholar
  6. 6.
    S. Juodkazis, K. Nishimura, H. Misawa, T. Ebisui, R. Waki, S. Matsuo, T. Okada, Adv. Mater. 18, 1361 (2006)CrossRefGoogle Scholar
  7. 7.
    S. Juodkazis, K. Nishimura, S. Tanaka, H. Misawa, E.G. Gamaly, B. Luther-Davies, L. Hallo, P. Nicolai, V.T. Tikhonchuk, Phys. Rev. Lett. 96, 166101 (2006)ADSCrossRefGoogle Scholar
  8. 8.
    T. Okada, T. Tomita, S. Matsuo, S. Hashimoto, Y. Ishida, S. Kiyama, T. Takahashi, J. Appl. Phys. 106, 054307 (2009)ADSCrossRefGoogle Scholar
  9. 9.
    M. Yamamoto, M. Deki, T. Takahashi, T. Tomita, T. Okada, S. Matsuo, S. Hashimoto, M. Yamaguchi, K. Nakagawa, N. Uehara, M. Kamano, Appl. Phys. Exp. 3, 016603 (2010)ADSCrossRefGoogle Scholar
  10. 10.
    M. Budiman, E.M. Hsu, H.K. Haugen, G.A. Botton, Appl. Phys. A 98, 849 (2010)ADSCrossRefGoogle Scholar
  11. 11.
    Y. Ozeki, T. Inoue, T. Tamaki, H. Yamaguchi, S. Onda, W. Watanabe, T. Sano, S. Nishiuchi, A. Hirose, K. Itoh, Appl. Phys. Exp. 1, 082601 (2008)ADSCrossRefGoogle Scholar
  12. 12.
    T. Tamaki, W. Watanabe, K. Itoh, Opt. Exp. 14, 10468 (2006)Google Scholar
  13. 13.
    T. Sano, S. Iwasaki, Y. Ozeki, K. Itoh, A. Hirose, Mater. Trans. 54, 926 (2013)CrossRefGoogle Scholar
  14. 14.
    H. Okamoto, T.B. Massalski, in Binary Alloy Phase Diagrams, vol. 1, ed. by T. B. Massalski, J.L. Murray, L.H. Bennett, H. Baker (American Society for Metals, Metals Park, 1986), p. 288Google Scholar
  15. 15.
    Y. Fukano, S. Ogawa, J. Phys. Soc. Jpn. 14, 1671 (1959)ADSCrossRefGoogle Scholar
  16. 16.
    Y. Fukano, J. Phys. Soc. Jpn. 16, 1195 (1961)ADSCrossRefGoogle Scholar
  17. 17.
    G. Bergmann, Phys. Rev. B 15, 1514 (1977)ADSCrossRefGoogle Scholar
  18. 18.
    Jin-Kuo Ho, Charng-Shyang Jong, Chien C. Chiu, Chao-Nien Huang, Kwang-Kuo Shih, Li-Chien Chen, Fu-Rong Chen, Ji-Jung Kai, J. Appl. Phys. 86, 4491 (1999)ADSCrossRefGoogle Scholar
  19. 19.
    W.S. Wong, T. Sands, N.W. Cheung, Appl. Phys. Lett. 72, 599 (1998)ADSCrossRefGoogle Scholar
  20. 20.
    J.M. Liu, Opt. Lett. 7, 196 (1982)ADSCrossRefGoogle Scholar
  21. 21.
    T. Tomita, M. Yamamoto, N. Hasegawa, K. Terakawa, Y. Minami, M. Nishikino, M. Ishino, T. Kaihori, Y. Ochi, T. Kawachi, M. Yamagiwa, T. Suemoto, Opt. Exp. 20, 29329 (2012)ADSCrossRefGoogle Scholar
  22. 22.
    S.N. Grigoriev, VYu. Fominskii, A.V. Gusarov, Met. Sci. Heat Treat. 54, 34 (2012)ADSCrossRefGoogle Scholar
  23. 23.
    B.N. Chichkov, C. Momma, S. Nolte, F. von Alvensleben, A. Tünnermann, Appl. Phys. A 63, 109 (1996)ADSCrossRefGoogle Scholar
  24. 24.
    H. Amano, M. Kito, K. Hiramatsu, I. Akasaki, Jpn. J. Appl. Phys. 28, L2112 (1989)ADSCrossRefGoogle Scholar
  25. 25.
    S. Nakamura, T. Mukai, M. Senoh, N. Iwasa, Jpn. J. Appl. Phys. 31, L139 (1992)ADSCrossRefGoogle Scholar
  26. 26.
    N. Kurose, K. Matsumoto, F. Yamada, T.M. Roffi, I. Kamiya, N. Iwata, Y. Aoyagi, AIP Adv. 8, 015329 (2018)ADSCrossRefGoogle Scholar

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© Springer-Verlag GmbH Germany, part of Springer Nature 2019

Authors and Affiliations

  1. 1.Division of Science and TechnologyTokushima UniversityTokushimaJapan
  2. 2.Graduate School of Advanced Technology and ScienceTokushima UniversityTokushimaJapan
  3. 3.Faculty of Engineering and DesignKagawa UniversityTakamatsuJapan

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