Computer vision measurement system for standards calibration in XY plane with sub-micrometer accuracy

  • Pedro Bastos CostaEmail author
  • Fabiana Rodrigues Leta
  • Felipe de Oliveira Baldner


Optical coordinate measuring is a highly functional tool for application in metrology laboratories, in areas of quality control and reverse engineering due to its versatility in terms of non-contact measurements. However, with the increasing requirements for high accuracy results in these areas, it is necessary to guarantee the traceability of this type of equipment using standards with compatible uncertainty. In order to provide traceability to these measurement systems, this research shows a method for calibration of dimensional length standard in image metrology. In this way, two lasers are used to measure the displacement of x- and y-axes simultaneously and the measurement values are applied in a mathematical model together with pixel positions from the images of a standard. The methodology shows advantages using high magnifications to visualize the standards, showing in each image just a small part of the area. The method provides uncertainties around 0.10 μm, showing that this method is capable of providing traceability for this kind of standard.


Optical CMM Dimensional Metrology Traceability 



The authors would like to thank the Dimensional Metrology Laboratory of Inmetro (Brazil) for providing the necessary structure to perform this research.


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Copyright information

© Springer-Verlag London Ltd., part of Springer Nature 2019

Authors and Affiliations

  • Pedro Bastos Costa
    • 1
    Email author
  • Fabiana Rodrigues Leta
    • 2
  • Felipe de Oliveira Baldner
    • 2
  1. 1.Federal University of Minas Gerais (UFMG)Universidade Federal de Minas GeraisBelo HorizonteBrazil
  2. 2.Post-Graduation Program on Mechanical Engineering - UFF-PGMECFluminense Federal UniversityNiteróiBrazil

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