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Computing theK-terminal reliability for SONET self-healing rings

Abstract

Synchronous Optical Network (SONET) technology has made highspeed self-healing ring (SHR) architectures practical and economical for the uses in many local exchange carriers’ intra local access transport area telecommunication networks. This paper analyses theK-terminal reliability, i.e., the probability that a subset ofk specific terminal stations of an SONET SHR can communicate, for four types of SONET SHRs and derives theirK-terminal reliability expressions.

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Author information

Correspondence to Fanjia Kong.

Additional information

Supported by the National Natural Science Foundation of China.

Kong Fanjia is an Associate Professor of Department of Applied Mathematics at the Northeastern University, Shenyang. He received his B.S. and M.S. degrees in Applied Mathematics in 1987 and 1990, respectively, and received his Ph.D. degree in Computer applications in 1998 from Northeastern University. His research interests are network reliability and fault tolerant computing.

WANG Guangxing was born in 1937 and graduated from the Automatic Control Department, Northeastern University, in 1962. From 1980 to 1982, he was a visiting scholar at Rensselaer Polytechnic Institute, Troy, NY. Now he is a Professor at Northeastern University. His research interests include network reliability, fault tolerant computing, and broadband local area networks. He is the author of over 100 refereed publications.

ZHANG Xiangde is an Associate Professor of Department of Applied Mathematics at the Northeastern University, Shenyang. He received his B.S. degree in Mathematics from Shangdong University in 1983, and M.S. and Ph.D. degrees in Computational Mathematics in 1991 and 1994 from Dalian University of Technology, respectively. Now his research interests are network reliability and fault tolerant computing.

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Kong, F., Wang, G. & Zhang, X. Computing theK-terminal reliability for SONET self-healing rings. J. Comput. Sci. & Technol. 14, 580–584 (1999). https://doi.org/10.1007/BF02951878

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Keywords

  • K-terminal reliability
  • SONET self-healing ring
  • reliability expression