Springer Nature is making SARS-CoV-2 and COVID-19 research free. View research | View latest news | Sign up for updates

Effect of crystal surface defects on the scattering intensity of X rays

  • 15 Accesses

Abstract

The effect of surface defects on the intensity of scattered x rays is investigated. A method is proposed for the determination of the thickness of deformed surface layers.

This is a preview of subscription content, log in to check access.

Literature cited

  1. 1.

    W. L. Bragg, R. W. James, and C. M. Bosanquet, Philos. Mag.,41, 109 (1921);42, l (1921) 44, 433 (1922).

  2. 2.

    E. Wagner and M. Kulenkanpff, Ann. Phys.,68, 369 (1922).

  3. 3.

    Y. Sakisaka, Proc. Math. Phys. Soc. (Jpn.),12, 189 (1930).

  4. 4.

    Y. Sakisaka and I. Sumato, Proc. Math. Phys. Soc. (Jpn.),13, 211 (1931).

  5. 5.

    P. A. Besirganyan and V. G. Aslanyan, Izv. Vyssh. Uchebn. Zaved., Fiz. (1983).

  6. 6.

    N. Kato, Acta Geol. Bratislava,14, 43 (1968).

  7. 7.

    R. W. James, Solid-State Phys.,15, 53 (1963).

Download references

Author information

Additional information

Translated from Izvestiya Vysshikh Uchebnykh Zavedenii, Fizika, No. 1, pp. 68–71, January, 1984.

Rights and permissions

Reprints and Permissions

About this article

Cite this article

Bezirganyan, P.A., Aslayan, V.G. Effect of crystal surface defects on the scattering intensity of X rays. Soviet Physics Journal 27, 57–61 (1984). https://doi.org/10.1007/BF00896412

Download citation

Keywords

  • Surface Layer
  • Surface Defect
  • Crystal Surface
  • Deformed Surface Layer