In this work the problem of the localness of the four-probe method of resistivity measurement in inhomogeneous semiconductor materials is examined. An analysis is conducted of the dependence of the localness of the four-probe method on the type of inhomogeneity of the sample in question and on the relative experimental error. The results obtained are presented in graphical form.
This is a preview of subscription content, log in to check access.
Buy single article
Instant access to the full article PDF.
Price includes VAT for USA
Subscribe to journal
Immediate online access to all issues from 2019. Subscription will auto renew annually.
This is the net price. Taxes to be calculated in checkout.
L. B. Valdes, Proc. I. R. E.,42, No. 2, 420 (1954).
O. B. Orzhevskii and V. I. Fistul', Zavodskaya Laboratoriya,27, No. 10, 236 (1961).
H. H. Gegenwarth, Solid St. Electron.,11, No. 8, 787 (1968).
A. Peyre-Lavigne, I. Casanovas et al., L'Onde Électrique,48, No. 490, 37 (1968).
N. N. Polyakov, A. S. Kukui, et al., Izv. Akad. Nauk SSSR, Ser. Fiz.,35, No. 3, 538 (1971).
A. I. Emel'yanov and V. L. Kon'kov, Izv. Vuzov SSSR, Fiz., No. 5, 114 (1967).
J. D. Jackson, Classical Electrodynamics, Wiley, New York (1962), Chap. 2.
Translated from Izvestiya Vysshikh Uchebnykh Zavedenii, Fizika, No. 10, pp. 39–43, October, 1973.
About this article
Cite this article
Polyakov, N.N. On the localness of the four-probe method of semiconductor resistivity measurement. Soviet Physics Journal 16, 1371–1374 (1973). https://doi.org/10.1007/BF00894405
- Experimental Error
- Resistivity Measurement
- Semiconductor Material
- Graphical Form
- Relative Experimental Error