Advertisement

Springer Nature is making Coronavirus research free. View research | View latest news | Sign up for updates

On the localness of the four-probe method of semiconductor resistivity measurement

  • 43 Accesses

Abstract

In this work the problem of the localness of the four-probe method of resistivity measurement in inhomogeneous semiconductor materials is examined. An analysis is conducted of the dependence of the localness of the four-probe method on the type of inhomogeneity of the sample in question and on the relative experimental error. The results obtained are presented in graphical form.

This is a preview of subscription content, log in to check access.

Literature cited

  1. 1.

    L. B. Valdes, Proc. I. R. E.,42, No. 2, 420 (1954).

  2. 2.

    O. B. Orzhevskii and V. I. Fistul', Zavodskaya Laboratoriya,27, No. 10, 236 (1961).

  3. 3.

    H. H. Gegenwarth, Solid St. Electron.,11, No. 8, 787 (1968).

  4. 4.

    A. Peyre-Lavigne, I. Casanovas et al., L'Onde Électrique,48, No. 490, 37 (1968).

  5. 5.

    N. N. Polyakov, A. S. Kukui, et al., Izv. Akad. Nauk SSSR, Ser. Fiz.,35, No. 3, 538 (1971).

  6. 6.

    A. I. Emel'yanov and V. L. Kon'kov, Izv. Vuzov SSSR, Fiz., No. 5, 114 (1967).

  7. 7.

    J. D. Jackson, Classical Electrodynamics, Wiley, New York (1962), Chap. 2.

Download references

Author information

Additional information

Translated from Izvestiya Vysshikh Uchebnykh Zavedenii, Fizika, No. 10, pp. 39–43, October, 1973.

Rights and permissions

Reprints and Permissions

About this article

Cite this article

Polyakov, N.N. On the localness of the four-probe method of semiconductor resistivity measurement. Soviet Physics Journal 16, 1371–1374 (1973). https://doi.org/10.1007/BF00894405

Download citation

Keywords

  • Experimental Error
  • Resistivity Measurement
  • Semiconductor Material
  • Graphical Form
  • Relative Experimental Error