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Numerical analysis of functionally integrated VLSI elements with thermal effects taken into account. III. Results of modeling

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Abstract

Results of a two-dimensional numerical modeling of a single-collector I2L element with thermal effects taken into account are described.

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Literature cited

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    I. I. Abramov and V. V. Kharitonov, Inzh.-Fiz. Zh.,54, No. 3, 493–499 (1988).

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    K. Hanikhara, H. Yanai, and T. Kamiya, IEEE Trans.,ED-29, No. 3, 418–430 (1982).

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    I. I. Abramov and V. V. Kharitonov, Inzh.-Fiz. Zh.,54, No. 2, 309–314 (1988).

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    I. I. Abramov and V. V. Kharitonov, Inzh.-Fiz. Zh.,51, No. 1, 136–143 (1986).

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Additional information

Translated from Inzhenero-Fizicheskii Zhurnal, Vol. 54, No. 5, pp. 823–828, May, 1988.

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Abramov, I.I., Kharitonov, V.V. Numerical analysis of functionally integrated VLSI elements with thermal effects taken into account. III. Results of modeling. Journal of Engineering Physics 54, 565–568 (1988). https://doi.org/10.1007/BF00872579

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Keywords

  • Statistical Physic
  • Numerical Modeling
  • Thermal Effect
  • VLSI Element