Epitaxial LaNiO3 metallic oxide thin films have been grown onc-axis oriented YBa2Cu3O7−δ thin films on 〈100〉 LaAlO3 substrates by pulsed laser deposition technique and the interface formed between the two films has been exmained by measuring the contact conductance of the same. The high value of specific contact conductance indicates the existence of a clean interface at the LaNiO3−YBaO2CuO3OO7−δ thin film contact.
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Kumar, D., Satyalakshmi, K.M., Hegde, M.S. et al. LaNiO3: A promising material for contact with YBa2Cu3O7− δ thin films. J Supercond 9, 17–18 (1996). https://doi.org/10.1007/BF00728418
- Metallic oxide films
- contact conductance