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Analog simulation of the nonideal behavior of superconducting Josephson microbridges

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The nonideal behavior of superconducting Josephson microbridges due to current-induced pair breaking and self-heating is investigated in an analog simulation experiment. The investigation is based upon the resistively shunted-junction model first treated by Aslamasov and Larkin, which has been extended phenomenologically. The new features in the behavior of the model and their dependence upon the strength and relaxation time of the additional pair-breaking and heating effects are demonstrated by means of their effect on the current-phase relation and the current-voltage characteristic of the Josephson element.

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Seifert, H. Analog simulation of the nonideal behavior of superconducting Josephson microbridges. J Low Temp Phys 50, 1–19 (1983). https://doi.org/10.1007/BF00681836

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  • Relaxation Time
  • Magnetic Material
  • Simulation Experiment
  • Heat Effect
  • Analog Simulation