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Refractometric characteristics of the polytypes of silicon carbide

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Literature cited

  1. 1.

    S. A. Dobrolezh, S. M. Zubkova, V. A. Kravets, et al., Silicon Carbide [in Russian], Kiev (1963).

  2. 2.

    J. P. Golightly, Can. Mineral.,10, No. 1, 105–109 (1969).

  3. 3.

    L. Patrick and W. J. Choyke, Phys. Rev. B,2, No. 6, 2255–2256 (1970).

  4. 4.

    V. A. Odarich, Zh. Prikl. Spektrosk.,15, No. 1, 160–162 (1971).

  5. 5.

    A. N. Pikhtin, V. T. Prokopenko, V. S. Rondarev, et al., Opt. Spektrosk.,43, No. 4, 711–717 (1977).

  6. 6.

    Yu. A. Makhalov and E. N. Mokhov, Fiz. Tverd. Tela,18, No. 8, 2482–2484 (1976).

  7. 7.

    Yu. M. Tairov, V. F. Tsvetkov, and Yu. Laukhe, Fiz. Tverd. Tela,19, No. 12, 3653–3656 (1977).

  8. 8.

    V. I. Levin, Yu. M. Tairov, and M. G. Travadzhyan, Neorg. Mater.,14, No. 6, 1062–1066 (1978).

  9. 9.

    S. A. Alekseev and V. T. Prokopenko, Izmer. Tekh., No. 9, 20–21 (1984).

  10. 10.

    A. N. Pikhtin and A. D. Yas'kov, Fiz. Tekh. Poluprovodn.,12, No. 6, 1047–1053 (1978).

  11. 11.

    B. E. Wheeler, Solid State Commun.,4, 173–175 (1966).

  12. 12.

    P. T. B. Shaffer and R. G. Naum, J. Opt. Soc. Am.,59, No. 11, 1498 (1969).

  13. 13.

    P. I. Baranskii, V. N. Klochkov, and I. V. Potykevich, Semiconductor Electronics [in Russian], Kiev (1975).

  14. 14.

    G. B. Dubrovskii, A. A. Lepneva, and E. I. Radovanova, Phys. Status Solidi B,57, No. 1, 423–431 (1973).

  15. 15.

    I. S. Gorban' and A. S. Skirda, Ukr. Fiz. Zh.,26, No. 2, 228–232 (1981).

  16. 16.

    S. A. Geidur, V. T. Prokopenko, and A. D. Yas'kov, Fiz. Tverd. Tela,20, No. 9, 2858–2860 (1978); V. B. Bogdanov, A. N. Pikhtin, V. F. Tsvetkov, et al., Opt. Spektrosk.,52, No. 6, 1071–1073 (1982).

  17. 17.

    G. A. Lomakina and Yu. A. Vodakov, Fiz. Tekh. Poluprovodn.,15, No. 1, 123–127 (1973).

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Additional information

Translated from Zhumal Prikladnoi Spektroskopii, Vol. 47, No. 5, pp. 815–819, November, 1987.

We sincerely thank Yu. M. Tairov and A. N. Pikhtin for their interest in this work and for useful discussions of the results.

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Alekseev, S.A., Bogdanov, V.B., Prokopenko, V.T. et al. Refractometric characteristics of the polytypes of silicon carbide. J Appl Spectrosc 47, 1182–1186 (1987). https://doi.org/10.1007/BF00659821

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Keywords

  • Silicon
  • Analytical Chemistry
  • Carbide
  • Molecular Structure
  • Silicon Carbide