Journal of Materials Science

, Volume 26, Issue 6, pp 1556–1564 | Cite as

Growth and optical properties of ZnIn2Se4 films

  • H. S. Soliman
  • M. M. El-Nahass
  • A. Qusto


Thin films of ZnIn2Se4 were deposited on quartz substrates at 297 K by the conventional thermal evaporation technique. The as-deposited films were amorphous. On annealing at 623 K under vacuum for 3 h, the films crystallized with a preferred (1 1 2) orientation corresponding to the chalcopyrite-type structure. Films deposited on a quartz substrate heated to 573 K were also crystalline. The optical constants were computed from the measured transmittance and reflectance at normal incidence of light in the wavelength range 400 to 2000 nm. The analysis of the data gave a direct gap of 2.2 and 2.06 eV for the amorphous and crystallized films, respectively. The dispersion curve exhibited a peak above the absorption edge. An indirect gap of 1.8 eV for the crystallized films and a direct forbidden gap of 1.75 eV for the amorphous films were also deduced. A direct allowed transition with a gap of 2.065 eV and an indirect transition with a gap of 1.69 eV were deduced for the crystalline films deposited on the heated substrate.


Absorption Edge Dispersion Curve Normal Incidence Optical Constant Thermal Evaporation 
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Copyright information

© Chapman and Hall Ltd. 1991

Authors and Affiliations

  • H. S. Soliman
    • 1
  • M. M. El-Nahass
    • 1
  • A. Qusto
    • 2
  1. 1.Faculty of EducationAin Shams UniversityHeliopolis, CairoEgypt
  2. 2.Faculty of ScienceKing Abdulaziz UniversityJeddaSaudi Arabia

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