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Journal of Materials Science

, Volume 29, Issue 16, pp 4371–4378 | Cite as

Interface microstructure between silicon and silver formed after eutectic brazing reaction

  • K. Suganuma
  • S. Sugihara
  • K. Okazaki
Papers

Abstract

The interface structure between silicon and silver after the eutectic reaction at 950°C has been examined primarily by using high-resolution transmission electron microscopy. Silver almost became a single crystal and a unique interface structure was found, where a special orientation relationship across the interface was recognized. The dominant relationship was obtained as {111}Ag ∥{111Si and [110]Ag ∥ [110]Si. The lattice arrangement model of the interface showed that the interface expressed by this relation has a good lattice match across the interface.

Keywords

Polymer Silicon Microstructure Transmission Electron Microscopy Orientation Relationship 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Chapman & Hall 1994

Authors and Affiliations

  • K. Suganuma
    • 1
  • S. Sugihara
    • 2
  • K. Okazaki
    • 2
  1. 1.Department of Materials Science and EngineeringNational Defence AcademyYokosukaJapan
  2. 2.Shonan Institute of TechnologyFujisawaJapan

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