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Journal of Materials Science

, Volume 28, Issue 4, pp 909–916 | Cite as

Creep behaviour of Si3N4/Y2O3/Al2O3/AIN alloys

  • J. Crampon
  • R. Duclos
  • N. Rakotoharisoa
Papers

Abstract

The compression creep behaviour of pressureless sintered Y2O3/Al2O3/AIN-doped Si3N4 was studied between 1473 and 1673 K, under stresses ranging from 100–300 MPa. Strain rate versus stress and temperature analysis give a stress exponent n≃1 and an activation energy Q=860 kJ mol−1. Microstructural change was investigated by transmission electron microscopy. The observed strain whorls, the stress exponent and the activation energy are indicative of a solution-diffusion-precipitation accommodated grain-boundary sliding where the diffusion through the glass is rate controlling.

Keywords

Polymer Microscopy Electron Microscopy Transmission Electron Microscopy Activation Energy 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Chapman & Hall 1993

Authors and Affiliations

  • J. Crampon
    • 1
  • R. Duclos
    • 1
  • N. Rakotoharisoa
    • 1
  1. 1.Laboratoire de Structure et Propriétés de l'état SolideURA CNRS 234, Bât C6, Université des Sciences et Technologies de LilleVilleneuve d'Ascq CedexFrance

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