Journal of Materials Science

, Volume 29, Issue 17, pp 4535–4544 | Cite as

SIMS, EDX, EELS, AES, XPS study of interphases in nicalon fibre-LAS glass matrix composites

Part II Chemistry of the interphases
  • C. Ponthieu
  • C. Marhic
  • M. Lancin
  • N. Herbots


Auger electron (AES), electron energy loss (EELS) and X-ray photoelectron spectroscopy (XPS) were used to identify the reaction products at the fibre-matrix interface in SiC nicalon fibre-LAS (Li2O, Al2O3, SiO2) or LAS + Nb2O5 glass matrix composites. Chemical bonding of the different elements was investigated by AES using sputter-depth profiling on fibres extracted from two matrices by etching in hydrofluoric acid. The chemistry of the silicium was studied by EELS in nicalon-LAS + Nb2O5 composite cross-sections. XPS was performed on fibres extracted from the nicalon-LAS + Nb2O5 composite to confirm EELS and AES results. These investigations show that in both composites the reaction scale at the fibre-matrix interface consists of a carbon layer next to the matrix and of a silicate phase rich in oxygen which contains carbon, probably in the form of a silicon oxycarbide, and which is located between the carbon layer and the fibre core.


Auger Nb2O5 Li2O Auger Electron Hydrofluoric Acid 
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Copyright information

© Chapman & Hall 1994

Authors and Affiliations

  • C. Ponthieu
    • 1
  • C. Marhic
    • 1
  • M. Lancin
    • 2
  • N. Herbots
    • 3
  1. 1.Physique des MatériauxCentre National de la Recherche ScientifiqueMeudon-cedexFrance
  2. 2.Physique CristallineInstitut des Materiaux de NantesNantes-cedex 03France
  3. 3.Department of Material Science and EngineeringMassachusetts Institute of TechnologyUSA

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