Journal of Materials Science

, Volume 30, Issue 6, pp 1613–1616 | Cite as

Analytical electron microscopy study of a new phase in an equiatomic Ti50Pd50 alloy

  • L. Chang
  • Y. C. Lo
  • S. K. Wu


Analytical electron microscopy has been used to study a new phase found in a Ti50 Pd50 alloy. The new phase was formed as ellipsoidal particles along the grain boundaries of the martensitic matrix. The crystal structure was identified as trigonal, with lattice parameters of a=0.83 nm, and c=2.62 nm, and point group ¯3m. The phase contains 68–73 at% Ti (48–54 wt% Ti).


Polymer Microscopy Electron Microscopy Crystal Structure Microscopy Study 
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  1. 1.
    K. Otsuka and K. Shimizu, Int. Met. Rev. 31 (1986) 93.CrossRefGoogle Scholar
  2. 2.
    S. Miyazaki and K. Otsuka, ISI J. Int. 29 (1989) 353.CrossRefGoogle Scholar
  3. 3.
    T. Tadaki, K. Otsuka and K. Shimizu, Ann. Rev. Mater. Sci. 18 (1989) 1.Google Scholar
  4. 4.
    V. N. Khachin, N. M. Matveeva, V. P. Sivokha, D. B. Chernov and Yu. K. Kovneristyi, translated from Dokl. Akad. Naud. SSSR. 257 (1981) 167.Google Scholar
  5. 5.
    N. M. Matveeva, Yu. K. Kovneristyi, A. S. Szvinov, V. P. Sivkha, and V. N. Khachin, J.Phys. 43 (1982) C4–249.Google Scholar
  6. 6.
    V. P. Sivokha, A. S. Savvinov, V. P. Vornin and V. N. Khachin, Phys. Met. Metal. 56 (1983) 112.Google Scholar
  7. 7.
    A. L. Lotokov, V. N. Grishkov and V. V. Fadin, Phys. Status Solidi 70a (1982) 513.CrossRefGoogle Scholar
  8. 8.
    Y. C. Lo, S. K. Wu and C. M. Wayman, Scripta Metall. Mater. 24 (1990) 1571.CrossRefGoogle Scholar
  9. 9.
    H. C. Donkersloot and J. H. N. Van Vucht, J. Less Common Metal 20 (1970) 83.CrossRefGoogle Scholar
  10. 10.
    J. L. Murray, in “ASM Handbook, Vol. 3, Alloy Phase Diagrams”, (ASM International, Ohio, USA, 1992) pp. 2–341.Google Scholar
  11. 11.
    M. H. Loretto, in “Electron Beam Analysis of Materials” (Chapman and Hall, London, 1984) Ch. 4.CrossRefGoogle Scholar
  12. 12.
    B. F. Buxton, J. A. Eades, J. W. Steeds and G. M. Rackham, Phil. Trans. R. Soc. A 281 (1976) 171.CrossRefGoogle Scholar
  13. 13.
    T. Hahn (ed.), “International Tables for Crystallography”, Vol. 4. (The International Union of Crystallography, Derdrecht, Holland, 1983) Vol. 4.Google Scholar
  14. 14.
    G. Cliff and G. W. Lorimer, J. Microscopy 103 (1975) 203.CrossRefGoogle Scholar
  15. 15.
    H. C. Yi, J. J. Moore and A. Petric, Metall. Trans. A 23 (1992) 59.CrossRefGoogle Scholar

Copyright information

© Chapman & Hall 1995

Authors and Affiliations

  • L. Chang
    • 1
  • Y. C. Lo
    • 2
  • S. K. Wu
    • 2
  1. 1.Materials Research LaboratoriesIndustrial Technology Research InstituteChutung, HsinchuTaiwan
  2. 2.Institute of Materials Science and EngineeringNational Taiwan UniversityTaipeiTaiwan

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