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Journal of Materials Science

, Volume 31, Issue 7, pp 1803–1808 | Cite as

An experimental micromechanics measurement technique for submicrometre domains

  • C. R. Corleto
  • W. L. Bradley
  • H. F. Brinson
Article

Abstract

Orthogonal arrays of dots applied to surfaces can be used to directly measure microscopic strain fields. The spatial and strain resolution are both limited by the size of the dots placed on the surface. Two techniques using the beam of a scanning electron microscope (SEM) have been developed which make possible the placement of very fine dots with diameters of only 0.5 and 0.02 μm, respectively, on the surface of the specimen, allowing local strain measurements on the scale of 0.2–10 μm when specimens are loaded in the SEM. Measurements of strains fields around the tips of growing cracks in both polymers and polymeric composites are presented to illustrate the capabilities of the technique.

Keywords

Polymer Electron Microscope Scanning Electron Microscope Measurement Technique Material Processing 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Chapman & Hall 1996

Authors and Affiliations

  • C. R. Corleto
    • 1
  • W. L. Bradley
    • 2
  • H. F. Brinson
    • 3
  1. 1.Department of Mechanical and Industrial EngineeringTexas A&M University at KingsvilleKingsvilleUSA
  2. 2.Department of Mechanical EngineeringTexas A&M UniversityCollege StationUSA
  3. 3.Department of Mechanical EngineeringUniversity of HoustonHoustonUSA

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