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Journal of Materials Science

, Volume 30, Issue 24, pp 6243–6248 | Cite as

Characterization of Pb(Zr, Ti)O3 thin films obtained by MOD

  • E. Nieto
  • J. F. Fernandez
  • C. Moure
  • P. Duran
Article

Abstract

Pb(Zr, Ti)O3 thin films were deposited by dip-coating on polycrystalline alumina substrates by using an MOD method. The thickness and homogeneity of the films were measured as a function of dip rates and solution concentration. Heating and cooling schedules determined the main structure of the crystallized films. Rheology measurements and Fourier transform-infrared spectra were carried out to obtain a better knowledge of the solution features. A microstructural development study and some ferroelectric measurements were also carried out.

Keywords

Polymer Alumina Fourier Solution Concentration Material Processing 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Chapman & Hall 1995

Authors and Affiliations

  • E. Nieto
    • 1
  • J. F. Fernandez
    • 1
  • C. Moure
    • 1
  • P. Duran
    • 1
  1. 1.Electroceramics DepartmentInstituto de Cerámica y Vidrio (CSIC)MadridSpain

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