Journal of Materials Science

, Volume 30, Issue 24, pp 6243–6248 | Cite as

Characterization of Pb(Zr, Ti)O3 thin films obtained by MOD

  • E. Nieto
  • J. F. Fernandez
  • C. Moure
  • P. Duran


Pb(Zr, Ti)O3 thin films were deposited by dip-coating on polycrystalline alumina substrates by using an MOD method. The thickness and homogeneity of the films were measured as a function of dip rates and solution concentration. Heating and cooling schedules determined the main structure of the crystallized films. Rheology measurements and Fourier transform-infrared spectra were carried out to obtain a better knowledge of the solution features. A microstructural development study and some ferroelectric measurements were also carried out.


Polymer Alumina Fourier Solution Concentration Material Processing 
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Copyright information

© Chapman & Hall 1995

Authors and Affiliations

  • E. Nieto
    • 1
  • J. F. Fernandez
    • 1
  • C. Moure
    • 1
  • P. Duran
    • 1
  1. 1.Electroceramics DepartmentInstituto de Cerámica y Vidrio (CSIC)MadridSpain

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