Advertisement

Journal of Materials Science

, Volume 31, Issue 3, pp 581–587 | Cite as

Change in the type of majority carriers in disordered lnxSe100−x thin-film alloys

  • S. Marsillac
  • J. C. Bernéde
  • A. Conan
Papers

Abstract

Electrical, optical and physico-chemical properties of disordered InxSe100−x thin films have been investigated for x ranging from 40–65. The films are found to be p-type for composition ranging from 45–60 at% selenium and n-type for compositions below 40 at% selenium. An increase in the conductivity, together with a decrease of the activation energy and of the optical gap, has also been observed when x varies from 40–65. These results have been interpreted through a theory based on the relative percentage evolution of the In-In and Se-Se chemical bonds and, on the other hand, by a percolation theory due to microcrystalline structures and indium filaments. These two models are discussed in reference to other publications.

Keywords

Polymer Indium Thin Film Activation Energy Selenium 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

Preview

Unable to display preview. Download preview PDF.

Unable to display preview. Download preview PDF.

References

  1. 1.
    K. ANDO and A. KATSUI, Thin Solid Films 76 (1981) 141.CrossRefGoogle Scholar
  2. 2.
    T. MATSUSHITA, A. SUZUKI, M. OKUDA and T. SAKAI, Jpn. J. Appl. Phys. Suppl. 19/2 (1980) 123.CrossRefGoogle Scholar
  3. 3.
    M. DIGIULIO, G. MICOCCI, A. RIZZO and R. TEPORE, J. Appl. Phys. 54 (1983) 5839.CrossRefGoogle Scholar
  4. 4.
    A. SEGURA, J. P. GUESDON and J. M. BESSON, A. CHEVY, ibid. 54 (1983) 876.CrossRefGoogle Scholar
  5. 5.
    M. DIGIULIO, G. MICOCCI, R. RELLA, P. SICILIANO and A. TEPORE, Thin Solid Films 148 (1987) 273.CrossRefGoogle Scholar
  6. 6.
    Y. HASEGAWA and Y. ABE, Phys. Status Solidi A 70 (1982) 615.CrossRefGoogle Scholar
  7. 7.
    M. A. KENAWY, A. F. EL-SHAZLY, M. A. AFIFI, H. A. ZAYED and H. A. EL-ZAHID, Thin Solid Films 200 (1991) 203.CrossRefGoogle Scholar
  8. 8.
    S. P. GRINDLE, J. Appl. Phys. (USA) 51 (1980) 5464.CrossRefGoogle Scholar
  9. 9.
    F. S. JIANG, L. HOU, S. GAN and F.X. GAN, in “Proc. SPIE Optical Data Storage Topical Meeting”, Vol. 1078 (International Society Optical Engineers, USA, 1989) 165.Google Scholar
  10. 10.
    K. UTSUMI, V. GOTO, I. TSUGAWA, T. YUASA, N. KOSHINO and S. OGAWA, in SPIE, Optical Storage Technology and Application, Vol. 899 (International Society Optical Engineers, USA, 1988) p. 196.CrossRefGoogle Scholar
  11. 11.
    N. F. MOTT and E. A. DAVIS, “Electronic Process in Non-Crystalline Materials”, 2nd Edn (Clarendon Press, Oxford 1979).Google Scholar
  12. 12.
    A. B. Onys' KIV, Yu M. ORISHCHIN, U. P. SAVCHIN, I. M. STAKHIRA, I. M. FETSYUKH, Sov. Phys. Semicond. 24 (1990) 264.Google Scholar
  13. 13.
    I. WATANABE and T. YAMAMOTO, Jpn J. Appl. Phys. 24 (1985) 1282.CrossRefGoogle Scholar
  14. 14.
    H. NAITO, M. OKUDA, T. MATSUSHITA and T. NAKAU, Jpn J. Appl. Phys. 19 (1980) L513.CrossRefGoogle Scholar
  15. 15.
    S. Ramchandar RAO, M. NAGABHOOSHANAM and V. Hari BABU, Cryst. Res. Technol. 25 (1990) 55.CrossRefGoogle Scholar
  16. 16.
    T. MATSUSHITA, T. T. NANG, M. OKUDA, A. SUZUKI and S. YOKOTA, Jpn J. Appl. Phys. 15 (1976) 901.CrossRefGoogle Scholar
  17. 17.
    S. K. BISWAS, S. CHAUDHURI and A. CHOUDHURY, Phys. Status. Solidi (a) 105 (1988) 467.CrossRefGoogle Scholar
  18. 18.
    D. V. Krishna SASTRY and P. Jayarama REDDY, Thin Solid Films 105 (1983) 139.CrossRefGoogle Scholar
  19. 19.
    J. SHIGETOMI, H. OHKUBO and T. IKARI. J. Appl. Phys. 66 (1989) 215.CrossRefGoogle Scholar
  20. 20.
    J. C. BERNÈDE, G. SAFOULA, A. AMEZIANE and P. BURGAUD, Phys. Status Solidi (a) 11 (1988) 521.CrossRefGoogle Scholar
  21. 21.
    F. ANTONANGELLI, M. PIACENTINI, A. BALZAROTTI, V. GRASSO, R. GIRLANDA and E. DONI, Il Nuovo Cimento 51 B(1) (1979) 181.CrossRefGoogle Scholar
  22. 22.
    C. D. WAGNER, W. M. RIGGS, M. E. DAVIS, S. F. MOULDER and G. E. MUILENBERG, “Handbook of X-ray Photoelectron Spectroscopy CD” (Perkin-Elmer, Eden Prairie, MN, 1979).Google Scholar
  23. 23.
    C. CARDINAUD, G. TURBAN, B. CROS and M. RIBES, Thin Solid Films 205 (1991).CrossRefGoogle Scholar
  24. 24.
    R. ROUSINA, G. K. SHIVAKUMAR and G. H. YOUSEFI, Vacuum 41 (1990) 1451.CrossRefGoogle Scholar
  25. 25.
    T. P. SHARMA, S. K. SHARMA, R. KUMAR and Garina JAIN, Ind. J. Pure Appl. Phys. 28 (1990) 486.Google Scholar
  26. 26.
    A. KUMAR, M. M. MALIK, M. ZULFEQUAR, A. KUMAR and M. HUSAIN, Solid State Commun. 79 (1991) 699.CrossRefGoogle Scholar
  27. 27.
    M. KASTNER, J. Non-Cryst. Solids 31 (1978) 223.CrossRefGoogle Scholar
  28. 28.
    M. KASTNER and H. FRITZSCHE, Philos. Mag. B 37 (1978) 199.CrossRefGoogle Scholar
  29. 29.
    R. A. STREET and G. LUCOVSKY, Solid State Commun. 31 (1979) 289.CrossRefGoogle Scholar
  30. 30.
    N. TOHGE, T. MINANI, Y. YAMAMOTO and M. TANAKA, J. Appl. Phys. 51 (1980) 1048.CrossRefGoogle Scholar
  31. 31.
    J. H. C. HOGG, H. H. SUTHERLAND and D. J. WILLIAMS, Acta Crystallogr. B 29 (1973) 1590.CrossRefGoogle Scholar
  32. 32.
    S. KUMAR, S. C. KASHYAP and K. L. CHOPRA, Thin Solid Films 217 (1992) 146.CrossRefGoogle Scholar
  33. 33.
    L. TICHY, H. TICHA and A. TRISKA, Solid State Commun. 53 (1985) 399.CrossRefGoogle Scholar
  34. 34.
    T. T. NANG, M. OKUDA, T. MATSUSHITA, S. YOKOTA and A. SUZUKI, Jpn J. Appl. Phys. 15 (1976) 849.CrossRefGoogle Scholar
  35. 35.
    F. ABOU-ELFOTOUH, D. J. DUNLAVY and T. J. COUTTS, Solar Cells 27 (1987) 237.CrossRefGoogle Scholar
  36. 36.
    S. M. WASIM, ibid. 16 (1986) 289.CrossRefGoogle Scholar
  37. 37.
    J. A. THORNTON, T. C. LOMMASSON, H. TALIEH and B. H. TSENG, ibid. 24 (1988) 1.CrossRefGoogle Scholar
  38. 38.
    A. ROCKETT, T. C. LOMMASSON, P. CAMPOS, L. C. YANG and H. TALIEN, Thin Solid Films 171 (1989) 109.CrossRefGoogle Scholar
  39. 39.
    A. H. CLARK, ibid. 108 (1983) 285.CrossRefGoogle Scholar
  40. 40.
    D. BIDJIN, S. POPOVIC and B. CELUSTKA Phys. Status Solidi(a) 6 (1971) 295.CrossRefGoogle Scholar

Copyright information

© Chapman & Hall 1996

Authors and Affiliations

  • S. Marsillac
    • 1
  • J. C. Bernéde
    • 1
  • A. Conan
    • 1
  1. 1.Faculté des Sciences et desTechniques de NantesLaboratoire de Physique des Matériaux pour l'ElectroniqueNantes cédex 03France

Personalised recommendations