Journal of Materials Science

, Volume 31, Issue 17, pp 4693–4695 | Cite as

Transmission electron microscopy observations of antiphase boundaries in CdTe

  • T. I. Milenov
  • V. I. Dimov


Specimens from CdTe crystals, prepared by two different methods were examined by transmission electron microscopy. Antiphase boundaries were observed in both the {110} and {311} planes. Comparatively regularly ordered partial dislocations with a Burgers vector b=a/6 〈112〉 were found in both cases. The distance between partial dislocations is about 6–8 nm. The probable formation mechanism of these boundaries is discussed.


Polymer Microscopy Electron Microscopy Transmission Electron Microscopy Material Processing 
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Copyright information

© Chapman & Hall 1996

Authors and Affiliations

  • T. I. Milenov
    • 1
  • V. I. Dimov
    • 2
  1. 1.Institute of Solid State PhysicsBulgarian Academy of SciencesSofiaBulgaria
  2. 2.Institute of Applied MineralogyBulgarian Academy of SciencesSofiaBulgaria

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