Journal of Materials Science

, Volume 30, Issue 16, pp 4043–4048 | Cite as

R-curve behaviour of sintered silicon nitride

  • Y. W. Kim
  • M. Mitomo
  • N. Hirosaki


R-curves for two in situ reinforced silicon nitrides A and B of different microstructures were determined by three different characterization methods. The saturated crack growth resistance was found to be 5.2, 7.2 and 9.2 MPa m1/2 for silicon nitride A and 5.8, 8.0 and 10.0 MPam1/2 for silicon nitride B, respectively, by indentation, indentation-crack growth, and indentation-strength methods. The rising behaviour of R-curves was also found to depend on the characterization method. These results indicate that care should be taken in interpreting and utilizing R-curves evaluated from different characterization methods and an R-curve characterization method with appropriate qualifiers is needed for rising R-curve materials.


Polymer Silicon Microstructure Nitride Material Processing 
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Copyright information

© Chapman & Hall 1995

Authors and Affiliations

  • Y. W. Kim
    • 1
  • M. Mitomo
    • 1
  • N. Hirosaki
    • 2
  1. 1.National Institute for Research in Inorganic MaterialsIbarakiJapan
  2. 2.Materials Research Laboratory, Nissan Research CentreNissan Motor Company LtdYokosukaJapan

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