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Journal of Materials Science

, Volume 30, Issue 22, pp 5576–5580 | Cite as

Analysis of microhardness data in TlxIn1−xSe

  • I. Y. Yanchev
  • E. P. Trifonova
  • Ch. Karakotsou
  • A. N. Anagnostopoulos
  • G. L. Bleris
Papers

Abstract

Microhardness measurements have been performed on TlxIn1−xSe semiconductors (x=0.0, 0.2, 0.3 ... 1.0). The microhardness, H, as a function of x shows a maximum at x ca. 0.5. A statistical evaluation of the obtained results leads to a log-normal distribution of the microhardness rather than, as expected, a polynomial one.

Keywords

Polymer Statistical Evaluation Material Processing Microhardness Measurement Microhardness Data 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Chapman & Hall 1995

Authors and Affiliations

  • I. Y. Yanchev
    • 1
  • E. P. Trifonova
    • 1
  • Ch. Karakotsou
    • 2
  • A. N. Anagnostopoulos
    • 2
  • G. L. Bleris
    • 2
  1. 1.Faculty of PhysicsSt Kliment Ohridski University of SofiaSofiaBulgaria
  2. 2.Solid State Section, Physics DepartmentAristotle University of ThessalonikiThessalonikiGreece

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