Journal of Materials Science

, Volume 30, Issue 22, pp 5576–5580 | Cite as

Analysis of microhardness data in TlxIn1−xSe

  • I. Y. Yanchev
  • E. P. Trifonova
  • Ch. Karakotsou
  • A. N. Anagnostopoulos
  • G. L. Bleris


Microhardness measurements have been performed on TlxIn1−xSe semiconductors (x=0.0, 0.2, 0.3 ... 1.0). The microhardness, H, as a function of x shows a maximum at x ca. 0.5. A statistical evaluation of the obtained results leads to a log-normal distribution of the microhardness rather than, as expected, a polynomial one.


Polymer Statistical Evaluation Material Processing Microhardness Measurement Microhardness Data 
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Copyright information

© Chapman & Hall 1995

Authors and Affiliations

  • I. Y. Yanchev
    • 1
  • E. P. Trifonova
    • 1
  • Ch. Karakotsou
    • 2
  • A. N. Anagnostopoulos
    • 2
  • G. L. Bleris
    • 2
  1. 1.Faculty of PhysicsSt Kliment Ohridski University of SofiaSofiaBulgaria
  2. 2.Solid State Section, Physics DepartmentAristotle University of ThessalonikiThessalonikiGreece

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