Journal of Materials Science

, Volume 30, Issue 14, pp 3734–3745 | Cite as

Characterization of SiC whiskers

  • L. K. Frevel
  • C. K. Saha
  • D. R. Petersen


The composition and microstructure of SiC whiskers from three different suppliers were studied to understand their physical and chemical properties. The following analytical methods were utilized: complete chemical analysis, morphological examination by scanning electron microscopy and by high-resolution transmission electron microscopy, selected-area electron diffraction, X-ray diffraction, and thermogravimetric analysis of the oxidation rate of the three SiC whiskers at 1050‡C in oxygen and at 1150‡C in air.


Oxidation Oxygen Polymer Microstructure Electron Microscopy 
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Copyright information

© Chapman & Hall 1995

Authors and Affiliations

  • L. K. Frevel
    • 1
  • C. K. Saha
    • 1
  • D. R. Petersen
    • 1
  1. 1.Dow Corning CorporationMidlandUSA

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