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Journal of Materials Science

, Volume 30, Issue 14, pp 3734–3745 | Cite as

Characterization of SiC whiskers

  • L. K. Frevel
  • C. K. Saha
  • D. R. Petersen
Papers

Abstract

The composition and microstructure of SiC whiskers from three different suppliers were studied to understand their physical and chemical properties. The following analytical methods were utilized: complete chemical analysis, morphological examination by scanning electron microscopy and by high-resolution transmission electron microscopy, selected-area electron diffraction, X-ray diffraction, and thermogravimetric analysis of the oxidation rate of the three SiC whiskers at 1050‡C in oxygen and at 1150‡C in air.

Keywords

Oxidation Oxygen Polymer Microstructure Electron Microscopy 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Chapman & Hall 1995

Authors and Affiliations

  • L. K. Frevel
    • 1
  • C. K. Saha
    • 1
  • D. R. Petersen
    • 1
  1. 1.Dow Corning CorporationMidlandUSA

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